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35 Publications
2006 | Journal Article | LibreCat-ID: 29684
Thomas, Andy, et al. “Inverted Spin Polarization of Heusler Alloys for Spintronic Devices.” Applied Physics Letters, vol. 89, no. 1, 012502, AIP Publishing, 2006, doi:10.1063/1.2219333.
LibreCat
| DOI
2006 | Journal Article | LibreCat-ID: 29686
Ehresmann, A., et al. “Fundamentals for Magnetic Patterning by Ion Bombardment of Exchange Bias Layer Systems.” Physica Status Solidi (b), vol. 243, no. 1, Wiley, 2006, pp. 29–36, doi:10.1002/pssb.200562442.
LibreCat
| DOI
2006 | Journal Article | LibreCat-ID: 29681
Schmalhorst, J., et al. “Magnetic and Chemical Properties of Co[Sub 2]MnSi Thin Films Compared to the Co[Sub 2]MnSi∕Al-O Interface.” Journal of Applied Physics, vol. 100, no. 11, 113903, AIP Publishing, 2006, doi:10.1063/1.2384806.
LibreCat
| DOI
2006 | Journal Article | LibreCat-ID: 29683
Höink, V., et al. “Switchable Resonant X-Ray Bragg Scattering on a Magnetic Grating Patterned by Ion Bombardment.” Journal of Applied Physics, vol. 100, no. 6, 063903, AIP Publishing, 2006, doi:10.1063/1.2349568.
LibreCat
| DOI
2006 | Journal Article | LibreCat-ID: 29682
Hütten, A., et al. “Spin-Electronic Devices with Half-Metallic Heusler Alloys.” Journal of Alloys and Compounds, vol. 423, no. 1–2, Elsevier BV, 2006, pp. 148–52, doi:10.1016/j.jallcom.2005.12.106.
LibreCat
| DOI
2005 | Journal Article | LibreCat-ID: 29691
Höink, V., et al. “Postannealing of Magnetic Tunnel Junctions with Ion-Bombardment-Modified Exchange Bias.” Applied Physics Letters, vol. 86, no. 15, 152102, AIP Publishing, 2005, doi:10.1063/1.1899771.
LibreCat
| DOI
2005 | Journal Article | LibreCat-ID: 29689
Schmalhorst, J., et al. “X-Ray Absorption and Magnetic Circular Dichroism Studies of Annealed Magnetic Tunnel Junctions.” Journal of Applied Physics, vol. 97, no. 12, 123711, AIP Publishing, 2005, doi:10.1063/1.1939086.
LibreCat
| DOI
2005 | Journal Article | LibreCat-ID: 29688
Schmalhorst, J., et al. “X-Ray Absorption and Magnetic Circular Dichroism Studies of Annealed Magnetic Tunnel Junctions.” Journal of Applied Physics, vol. 97, no. 12, 123711, AIP Publishing, 2005, doi:10.1063/1.1939086.
LibreCat
| DOI
2005 | Journal Article | LibreCat-ID: 29687
Sacher, Marc, et al. “Influence of Noble-Gas Ion Irradiation on Alumina Barrier of Magnetic Tunnel Junctions.” Journal of Applied Physics, vol. 98, no. 10, 103532, AIP Publishing, 2005, doi:10.1063/1.2134883.
LibreCat
| DOI
2004 | Journal Article | LibreCat-ID: 29696
Schmalhorst, J., et al. “X-Ray Absorption and Magnetic Circular Dichroism Studies of Ion-Bombarded Ferromagnet-Antiferromagnet Bilayers.” Physical Review B, vol. 70, no. 18, 184403, American Physical Society (APS), 2004, doi:10.1103/physrevb.70.184403.
LibreCat
| DOI
2004 | Journal Article | LibreCat-ID: 29693
Schmalhorst, J., et al. “X-Ray Absorption and Magnetic Circular Dichroism Studies of Ion-Bombarded Ferromagnet-Antiferromagnet Bilayers.” Physical Review B, vol. 70, no. 18, 184403, American Physical Society (APS), 2004, doi:10.1103/physrevb.70.184403.
LibreCat
| DOI
2004 | Journal Article | LibreCat-ID: 29690
Engel, D., et al. “Initialization of Unidirectional Anisotropy in a Ferromagnet–Antiferromagnet Bilayer by KeV-He Ion Bombardment.” Journal of Magnetism and Magnetic Materials, vol. 293, no. 3, Elsevier BV, 2004, pp. 849–53, doi:10.1016/j.jmmm.2004.12.003.
LibreCat
| DOI
2004 | Journal Article | LibreCat-ID: 29695
Schmalhorst, J., et al. “Interface Structure and Magnetism of Magnetic Tunnel Junctions with ACo2MnSielectrode.” Physical Review B, vol. 70, no. 2, 024426, American Physical Society (APS), 2004, doi:10.1103/physrevb.70.024426.
LibreCat
| DOI
2004 | Journal Article | LibreCat-ID: 29692
Dimopoulos, T., et al. “Thermal Annealing of Junctions with Amorphous and Polycrystalline Ferromagnetic Electrodes.” Journal of Applied Physics, vol. 96, no. 11, AIP Publishing, 2004, pp. 6382–86, doi:10.1063/1.1808899.
LibreCat
| DOI
2003 | Journal Article | LibreCat-ID: 29694
Thomas, A., et al. “Aluminum Oxidation by a Remote Electron Cyclotron Resonance Plasma in Magnetic Tunnel Junctions.” Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 21, no. 5, 2120, American Vacuum Society, 2003, doi:10.1116/1.1609480.
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| DOI