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84 Publications
2019 | Conference Paper | LibreCat-ID: 12918
A Hybrid Space Compactor for Adaptive X-Handling
M.U. Maaz, A. Sprenger, S. Hellebrand, in: 50th IEEE International Test Conference (ITC), IEEE, Washington, DC, USA, 2019, pp. 1–8.
LibreCat
M.U. Maaz, A. Sprenger, S. Hellebrand, in: 50th IEEE International Test Conference (ITC), IEEE, Washington, DC, USA, 2019, pp. 1–8.
2018 | Conference Paper | LibreCat-ID: 29460
Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture
R. Rezaeizadeh Rookerd, S. Sadeghi-Kohan, Z. Navabi, in: Proceedings of the 2018 on Great Lakes Symposium on VLSI, ACM, 2018.
LibreCat
| DOI
R. Rezaeizadeh Rookerd, S. Sadeghi-Kohan, Z. Navabi, in: Proceedings of the 2018 on Great Lakes Symposium on VLSI, ACM, 2018.
2018 | Conference Paper | LibreCat-ID: 4575
Tuning Stochastic Space Compaction to Faster-than-at-Speed Test
A. Sprenger, S. Hellebrand, in: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, Budapest, Hungary, 2018.
LibreCat
| DOI
A. Sprenger, S. Hellebrand, in: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, Budapest, Hungary, 2018.
2018 | Conference Paper | LibreCat-ID: 10575
Extending Aging Monitors for Early Life and Wear-Out Failure Prevention
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H.-J. Wunderlich, in: 27th IEEE Asian Test Symposium (ATS’18), 2018.
LibreCat
| DOI
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H.-J. Wunderlich, in: 27th IEEE Asian Test Symposium (ATS’18), 2018.
2018 | Conference Paper | LibreCat-ID: 29459
Near-Optimal Node Selection Procedure for Aging Monitor Placement
S. Sadeghi-Kohan, A. Vafaei, Z. Navabi, in: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), IEEE, 2018.
LibreCat
| DOI
S. Sadeghi-Kohan, A. Vafaei, Z. Navabi, in: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), IEEE, 2018.
2017 | Conference Paper | LibreCat-ID: 12973
Special Session on Early Life Failures
J. Deshmukh, W. Kunz, H.-J. Wunderlich, S. Hellebrand, in: 35th IEEE VLSI Test Symposium (VTS’17), IEEE, Caesars Palace, Las Vegas, Nevada, USA, 2017.
LibreCat
| DOI
J. Deshmukh, W. Kunz, H.-J. Wunderlich, S. Hellebrand, in: 35th IEEE VLSI Test Symposium (VTS’17), IEEE, Caesars Palace, Las Vegas, Nevada, USA, 2017.
2017 | Conference Paper | LibreCat-ID: 10576
Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test
M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017.
LibreCat
| DOI
M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017.
2017 | Conference Paper | LibreCat-ID: 29463
Universal mitigation of NBTI-induced aging by design randomization
M. Jenihhin, A. Kamkin, Z. Navabi, S. Sadeghi-Kohan, in: 2016 IEEE East-West Design & Test Symposium (EWDTS), IEEE, 2017.
LibreCat
| DOI
M. Jenihhin, A. Kamkin, Z. Navabi, S. Sadeghi-Kohan, in: 2016 IEEE East-West Design & Test Symposium (EWDTS), IEEE, 2017.
2016 | Conference Paper | LibreCat-ID: 12975
X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test
M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS’16), IEEE, Hiroshima, Japan, 2016, pp. 1–6.
LibreCat
| DOI
M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS’16), IEEE, Hiroshima, Japan, 2016, pp. 1–6.
2015 | Conference Paper | LibreCat-ID: 12976
Optimized Selection of Frequencies for Faster-Than-at-Speed Test
M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India, 2015, pp. 109–114.
LibreCat
| DOI
M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India, 2015, pp. 109–114.