Please note that LibreCat no longer supports Internet Explorer versions 8 or 9 (or earlier).

We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.

84 Publications


2015 | Conference Paper | LibreCat-ID: 29465
Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation
S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015.
LibreCat | DOI
 

2015 | Conference Paper | LibreCat-ID: 29466
Online self adjusting progressive age monitoring of timing variations
S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015.
LibreCat | DOI
 

2014 | Conference Paper | LibreCat-ID: 12977
FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects
S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’14), IEEE, Seattle, Washington, USA, 2014.
LibreCat | DOI
 

2014 | Conference Paper | LibreCat-ID: 46268
An off-line MDSI interconnect BIST incorporated in BS 1149.1
M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.
LibreCat | DOI
 

2014 | Conference Paper | LibreCat-ID: 46267
Improving polynomial datapath debugging with HEDs
S. Sadeghi-Kohan, P. Behnam, B. Alizadeh, M. Fujita, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.
LibreCat | DOI
 

2013 | Conference Paper | LibreCat-ID: 12979
Analyzing and Quantifying Fault Tolerance Properties
S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW’13), IEEE, Cordoba, Argentina, 2013.
LibreCat | DOI
 

2013 | Conference Paper | LibreCat-ID: 46271
BS 1149.1 extensions for an online interconnect fault detection and recovery
S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, Z. Navabi, in: 2012 IEEE International Test Conference, IEEE, 2013.
LibreCat | DOI
 

2013 | Conference Paper | LibreCat-ID: 46270
A new structure for interconnect offline testing
S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, Z. Navabi, in: East-West Design & Test Symposium (EWDTS 2013), IEEE, 2013.
LibreCat | DOI
 

2012 | Conference Paper | LibreCat-ID: 12980
Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test
A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, H.-J. Wunderlich, in: 13th IEEE Latin American Test Workshop (LATW’12), IEEE, Quito, Ecuador, 2012, pp. 1–4.
LibreCat | DOI
 

2012 | Conference Paper | LibreCat-ID: 12981
Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test
A. Cook, S. Hellebrand, H.-J. Wunderlich, in: 17th IEEE European Test Symposium (ETS’12), IEEE, Annecy, France, 2012, pp. 1–6.
LibreCat | DOI
 

Filters and Search Terms

(department=48) AND (type=conference)

status=public

Search

Filter Publications

Display / Sort

Sorted by: Publishing Year

Export / Embed