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84 Publications
2024 | Conference Paper | LibreCat-ID: 52744
H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich, “Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations,” in European Test Symposium, The Hague, Netherlands, May 20-24, 2024, The Hague, NL, p. 6.
LibreCat
2024 | Conference Paper | LibreCat-ID: 52742
H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich, “Vmin Testing under Variations: Defect vs. Fault Coverage,” in IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, Maceió, p. 6.
LibreCat
2024 | Conference Paper | LibreCat-ID: 52743
S. Hellebrand, S. Sadeghi-Kohan, and H.-J. Wunderlich, “Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle,” in International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, Xi’an, China, p. 1.
LibreCat
2024 | Conference Paper | LibreCat-ID: 52745
H.-J. Wunderlich, H. Jafarzadeh, and S. Hellebrand, “Robust Test of Small Delay Faults under PVT-Variations,” in International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, Xi’an, China, p. 1.
LibreCat
2023 | Conference Paper | LibreCat-ID: 46739
S. Sadeghi-Kohan, S. Hellebrand, and H.-J. Wunderlich, “Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication,” 2023, doi: 10.1109/dsn-w58399.2023.00056.
LibreCat
| DOI
2023 | Conference Paper | LibreCat-ID: 46738
S. Sadeghi-Kohan, J. D. Reimer, S. Hellebrand, and H.-J. Wunderlich, “Optimizing the Streaming of Sensor Data with Approximate Communication,” presented at the IEEE Asian Test Symposium (ATS’23), 2023.
LibreCat
2023 | Conference Paper | LibreCat-ID: 45830
H. Jafarzadeh et al., “Robust Pattern Generation for Small Delay Faults under Process Variations,” presented at the IEEE International Test Conference (ITC’23), Anaheim, USA, 2023.
LibreCat
2020 | Conference Paper | LibreCat-ID: 19422
A. Sprenger, S. Sadeghi-Kohan, J. D. Reimer, and S. Hellebrand, “Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study,” 2020.
LibreCat
2020 | Conference Paper | LibreCat-ID: 29200
S. Sadeghi-Kohan and S. Hellebrand, “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects,” 2020, doi: 10.1109/vts48691.2020.9107591.
LibreCat
| DOI
2020 | Conference Paper | LibreCat-ID: 19421
S. Holst et al., “Logic Fault Diagnosis of Hidden Delay Defects,” 2020.
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