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7 Publications
2000 | Conference Paper | LibreCat-ID: 39884
Hilleringmann U, Vieregge T, Horstmann J. Nanometer Scale Lateral Structures of MOS Type Layers. In: Proceedings Micro. Tec. ; 2000:49–53.
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1999 | Conference Paper | LibreCat-ID: 39890
Otterbach R, Hilleringmann U. High rate CVD-diamond etching for high temperature pressure sensor applications. In: 29th European Solid-State Device Research Conference. Vol 1. ; 1999:320-323.
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1998 | Conference Paper | LibreCat-ID: 39893
Horstmann JT, Hilleringmann U, Goser K. Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 nm MOS-Transistors. In: 28th European Solid-State Device Research Conference. ; 1998:512-515.
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1997 | Journal Article | LibreCat-ID: 39896
Heinrich LMH, Muller J, Hilleringmann U, et al. CMOS-compatible organic light-emitting diodes. IEEE Transactions on Electron Devices. 1997;44(8):1249-1252. doi:10.1109/16.605463
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| DOI
1996 | Conference Paper | LibreCat-ID: 39902
Muller J, Wirth G, Hilleringmann U, Goser K. Analyses of Sub 1/4-Micron MOS-Transistors by Visible Light Emission. In: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference. ; 1996:947-950.
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1996 | Conference Paper | LibreCat-ID: 39900
Horstmann JT, Hilleringmann U, Goser K. Characterization and Matching Analysis of 50 nm-NMOS-Transistors. In: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference. ; 1996:253-256.
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1996 | Conference Paper | LibreCat-ID: 39903
Horstmann J, Hilleringmann U, Goser K. ESSDERC’96, Bologna, Italy. In: Conf. Dig. Vol 253. ; 1996.
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