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7 Publications
2000 | Conference Paper | LibreCat-ID: 39884
Hilleringmann, U., Vieregge, T., & Horstmann, J. (2000). Nanometer Scale Lateral Structures of MOS Type Layers. Proceedings Micro. Tec, 49–53.
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1999 | Conference Paper | LibreCat-ID: 39890
Otterbach, R., & Hilleringmann, U. (1999). High rate CVD-diamond etching for high temperature pressure sensor applications. 29th European Solid-State Device Research Conference, 1, 320–323.
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1998 | Conference Paper | LibreCat-ID: 39893
Horstmann, J. T., Hilleringmann, U., & Goser, K. (1998). Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 nm MOS-Transistors. 28th European Solid-State Device Research Conference, 512–515.
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1997 | Journal Article | LibreCat-ID: 39896
Heinrich, L. M. H., Muller, J., Hilleringmann, U., Goser, K. F., Holmes, A., Hwang, D.-H., & Stern, R. (1997). CMOS-compatible organic light-emitting diodes. IEEE Transactions on Electron Devices, 44(8), 1249–1252. https://doi.org/10.1109/16.605463
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| DOI
1996 | Conference Paper | LibreCat-ID: 39902
Muller, J., Wirth, G., Hilleringmann, U., & Goser, K. (1996). Analyses of Sub 1/4-Micron MOS-Transistors by Visible Light Emission. ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 947–950.
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1996 | Conference Paper | LibreCat-ID: 39900
Horstmann, J. T., Hilleringmann, U., & Goser, K. (1996). Characterization and Matching Analysis of 50 nm-NMOS-Transistors. ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 253–256.
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1996 | Conference Paper | LibreCat-ID: 39903
Horstmann, J., Hilleringmann, U., & Goser, K. (1996). ESSDERC’96, Bologna, Italy. Conf. Dig, 253.
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