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40 Publications
2006 | Conference Paper | LibreCat-ID: 39842
C. Pannemann et al., “Encapsulating the active Layer of organic Thin-Film Transistors,” 2006, doi: 10.1109/polytr.2005.1596488.
LibreCat
| DOI
2005 | Journal Article | LibreCat-ID: 39846
Ch. Pannemann, T. Diekmann, and U. Hilleringmann, “Degradation of organic field-effect transistors made of pentacene,” Journal of Materials Research, vol. 19, no. 7, pp. 1999–2002, 2005, doi: 10.1557/jmr.2004.0267.
LibreCat
| DOI
2005 | Conference Paper | LibreCat-ID: 39848
Ch. Pannemann, T. Diekmann, and U. Hilleringmann, “On the degradation of organic field-effect transistors,” 2005, doi: 10.1109/icm.2004.1434210.
LibreCat
| DOI
2005 | Journal Article | LibreCat-ID: 39349
Ch. Pannemann, T. Diekmann, and U. Hilleringmann, “Degradation of organic field-effect transistors made of pentacene,” Journal of Materials Research, vol. 19, no. 7, pp. 1999–2002, 2005, doi: 10.1557/jmr.2004.0267.
LibreCat
| DOI
2005 | Journal Article | LibreCat-ID: 39574
M. Scharnberg et al., “Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics,” Applied Physics Letters, vol. 86, no. 2, Art. no. 024104, 2005, doi: 10.1063/1.1849845.
LibreCat
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2005 | Conference Paper | LibreCat-ID: 39835
R. Scholz et al., “Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry,” in SPIE Proceedings, 2005, doi: 10.1117/12.617004.
LibreCat
| DOI
2005 | Conference Paper | LibreCat-ID: 39834
R. Scholz et al., “Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry,” in SPIE Proceedings, 2005, doi: 10.1117/12.617004.
LibreCat
| DOI
2004 | Conference Paper | LibreCat-ID: 39872
U. Hilleringmann and C. Pannemann, “Imprint structured organic thin film transistors as driving circuit in single-use sensor applications,” in Fifth International Symposium on Instrumentation and Control Technology, 2004, doi: 10.1117/12.521463.
LibreCat
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2004 | Conference Paper | LibreCat-ID: 39873
R. Otterbach and U. Hilleringmann, “Piezoresistive pressure sensors in CVD diamond for high-temperature applications,” in Fifth International Symposium on Instrumentation and Control Technology, 2004, doi: 10.1117/12.521928.
LibreCat
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2003 | Conference Paper | LibreCat-ID: 39887
U. Hilleringmann, T. Vieregge, and J. T. Horstmann, “Masking and etching of silicon and related materials for geometries down to 25 nm,” 2003, doi: 10.1109/iecon.1999.822171.
LibreCat
| DOI
2003 | Conference Paper | LibreCat-ID: 39888
J. T. Horstmann, U. Hilleringmann, and K. Goser, “Matching analysis of NMOS-transistors with a channel length down to 30 nm,” 2003, doi: 10.1109/iecon.1999.822163.
LibreCat
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2003 | Conference Paper | LibreCat-ID: 39885
G. Wirth, U. Hilleringmann, J. T. Horstmann, and K. Goser, “Negative differential resistance in ultrashort bulk MOSFETs,” 2003, doi: 10.1109/iecon.1999.822164.
LibreCat
| DOI
2003 | Journal Article | LibreCat-ID: 39851
Ch. Pannemann, T. Diekmann, and U. Hilleringmann, “Nanometer scale organic thin film transistors with Pentacene,” Microelectronic Engineering, vol. 67–68, pp. 845–852, 2003, doi: 10.1016/s0167-9317(03)00146-1.
LibreCat
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2002 | Journal Article | LibreCat-ID: 39904
U. Hilleringmann and K. Goser, “Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip,” IEEE Transactions on Electron Devices, vol. 42, no. 5, pp. 841–846, 2002, doi: 10.1109/16.381978.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39912
I. Schönstein, J. Müller, U. Hilleringmann, and K. Goser, “Characterization of submicron NMOS devices due to visible light emission,” Microelectronic Engineering, vol. 21, no. 1–4, pp. 363–366, 2002, doi: 10.1016/0167-9317(93)90092-j.
LibreCat
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2002 | Journal Article | LibreCat-ID: 39914
U. Hilleringmann and K. Goser, “Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon,” Microelectronic Engineering, vol. 19, no. 1–4, pp. 211–214, 2002, doi: 10.1016/0167-9317(92)90425-q.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39906
E. Brass, U. Hilleringmann, and K. Schumacher, “System integration of optical devices and analog CMOS amplifiers,” IEEE Journal of Solid-State Circuits, vol. 29, no. 8, pp. 1006–1010, 2002, doi: 10.1109/4.297714.
LibreCat
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2002 | Journal Article | LibreCat-ID: 39907
E. Brass, U. Hilleringmann, and K. Schumacher, “System integration of optical devices and analog CMOS amplifiers,” IEEE Journal of Solid-State Circuits, vol. 29, no. 8, pp. 1006–1010, 2002, doi: 10.1109/4.297714.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39899
J. T. Horstmann, U. Hilleringmann, and K. Goser, “Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique,” Microelectronic Engineering, vol. 30, no. 1–4, pp. 431–434, 2002, doi: 10.1016/0167-9317(95)00280-4.
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