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21 Publications
2016 | Journal Article | LibreCat-ID: 10769
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., & De Micheli, G. (2016). Efficient Statistical Parameter Selection for Nonlinear Modeling of Process/Performance Variation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, PP(99), 1–1. https://doi.org/10.1109/TCAD.2016.2547908
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2016 | Journal Article | LibreCat-ID: 15879
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., Zhang, J., Micheli, G. D., Sanchez, E., & Reorda, M. S. (2016). A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors. ACM Journal on Emerging Technologies in Computing Systems, 1–13. https://doi.org/10.1145/2988234
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2015 | Journal Article | LibreCat-ID: 10770
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., & De Micheli, G. (2015). From Defect Analysis to Gate-Level Fault Modeling of Controllable-Polarity Silicon Nanowires. IEEE Transactions on Nanotechnology, 14(6), 1117–1126. https://doi.org/10.1109/TNANO.2015.2482359
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2015 | Conference Paper | LibreCat-ID: 10771
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., Zhang, J., De Micheli, G., Sanchez, E., & Reorda, M. S. (2015). On the design of a fault tolerant ripple-carry adder with controllable-polarity transistors. In 2015 IEEE Computer Society Annual Symposium on VLSI (pp. 491–496). IEEE. https://doi.org/10.1109/ISVLSI.2015.13
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2015 | Conference Paper | LibreCat-ID: 10772
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., & De Micheli, G. (2015). Fault modeling in controllable polarity silicon nanowire circuits. In Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition (pp. 453–458). EDA Consortium. https://doi.org/10.7873/DATE.2015.0428
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2014 | Conference Paper | LibreCat-ID: 10773
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., Yazdani, M., & De Micheli, G. (2014). Fast process variation analysis in nano-scaled technologies using column-wise sparse parameter selection. In 2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH) (pp. 163–168). IEEE. https://doi.org/10.1109/NANOARCH.2014.6880479
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2013 | Conference Paper | LibreCat-ID: 10774
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., Yazdani, M., & De Micheli, G. (2013). A fast TCAD-based methodology for Variation analysis of emerging nano-devices. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) (pp. 83–88). IEEE. https://doi.org/10.1109/DFT.2013.6653587
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2013 | Conference Paper | LibreCat-ID: 10775
Gaillardon, P.-E., Ghasemzadeh Mohammadi, H., & De Micheli, G. (2013). Vertically-stacked silicon nanowire transistors with controllable polarity: A robustness study. In 2013 14th Latin American Test Workshop-LATW (pp. 1–6). IEEE. https://doi.org/10.1109/LATW.2013.6562673
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2010 | Conference Paper | LibreCat-ID: 10776
Khatir, M., Ghasemzadeh Mohammadi, H., & Ejlali, A. (2010). Sub-threshold charge recovery circuits. In Computer Design (ICCD), 2010 IEEE International Conference on (pp. 138–144). IEEE. https://doi.org/10.1109/ICCD.2010.5647815
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2009 | Conference Paper | LibreCat-ID: 10777
Ghasemzadeh Mohammadi, H., Miremadi, S. G., & Ejlali, A. (2009). Signature Self Checking (SSC): A Low-Cost Reliable Control Logic for Pipelined Microprocessors. In Dependable Computing (PRDC), 2009 IEEE Pacific Rim International Symposium on (pp. 252–255). IEEE. https://doi.org/10.1109/PRDC.2009.69
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