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21 Publications
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2016 | Journal Article | LibreCat-ID: 10769
Ghasemzadeh Mohammadi H, Gaillardon P-E, De Micheli G. Efficient Statistical Parameter Selection for Nonlinear Modeling of Process/Performance Variation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2016;PP(99):1-1. doi:10.1109/TCAD.2016.2547908
LibreCat
| DOI
2016 | Journal Article | LibreCat-ID: 15879
Ghasemzadeh Mohammadi H, Gaillardon P-E, Zhang J, Micheli GD, Sanchez E, Reorda MS. A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors. ACM Journal on Emerging Technologies in Computing Systems. 2016:1-13. doi:10.1145/2988234
LibreCat
| DOI
2015 | Journal Article | LibreCat-ID: 10770
Ghasemzadeh Mohammadi H, Gaillardon P-E, De Micheli G. From Defect Analysis to Gate-Level Fault Modeling of Controllable-Polarity Silicon Nanowires. IEEE Transactions on Nanotechnology. 2015;14(6):1117-1126. doi:10.1109/TNANO.2015.2482359
LibreCat
| DOI
2015 | Conference Paper | LibreCat-ID: 10771
Ghasemzadeh Mohammadi H, Gaillardon P-E, Zhang J, De Micheli G, Sanchez E, Reorda MS. On the design of a fault tolerant ripple-carry adder with controllable-polarity transistors. In: 2015 IEEE Computer Society Annual Symposium on VLSI. IEEE; 2015:491-496. doi:10.1109/ISVLSI.2015.13
LibreCat
| DOI
2015 | Conference Paper | LibreCat-ID: 10772
Ghasemzadeh Mohammadi H, Gaillardon P-E, De Micheli G. Fault modeling in controllable polarity silicon nanowire circuits. In: Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition. EDA Consortium; 2015:453-458. doi:10.7873/DATE.2015.0428
LibreCat
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