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21 Publications
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2016 | Journal Article | LibreCat-ID: 10769
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., & De Micheli, G. (2016). Efficient Statistical Parameter Selection for Nonlinear Modeling of Process/Performance Variation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, PP(99), 1–1. https://doi.org/10.1109/TCAD.2016.2547908
LibreCat
| DOI
2016 | Journal Article | LibreCat-ID: 15879
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., Zhang, J., Micheli, G. D., Sanchez, E., & Reorda, M. S. (2016). A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors. ACM Journal on Emerging Technologies in Computing Systems, 1–13. https://doi.org/10.1145/2988234
LibreCat
| DOI
2015 | Journal Article | LibreCat-ID: 10770
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., & De Micheli, G. (2015). From Defect Analysis to Gate-Level Fault Modeling of Controllable-Polarity Silicon Nanowires. IEEE Transactions on Nanotechnology, 14(6), 1117–1126. https://doi.org/10.1109/TNANO.2015.2482359
LibreCat
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2015 | Conference Paper | LibreCat-ID: 10771
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., Zhang, J., De Micheli, G., Sanchez, E., & Reorda, M. S. (2015). On the design of a fault tolerant ripple-carry adder with controllable-polarity transistors. In 2015 IEEE Computer Society Annual Symposium on VLSI (pp. 491–496). IEEE. https://doi.org/10.1109/ISVLSI.2015.13
LibreCat
| DOI
2015 | Conference Paper | LibreCat-ID: 10772
Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., & De Micheli, G. (2015). Fault modeling in controllable polarity silicon nanowire circuits. In Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition (pp. 453–458). EDA Consortium. https://doi.org/10.7873/DATE.2015.0428
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