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21 Publications
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2016 | Journal Article | LibreCat-ID: 10769
Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, and Giovanni De Micheli. “Efficient Statistical Parameter Selection for Nonlinear Modeling of Process/Performance Variation.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems PP, no. 99 (2016): 1–1. https://doi.org/10.1109/TCAD.2016.2547908.
LibreCat
| DOI
2016 | Journal Article | LibreCat-ID: 15879
Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, Jian Zhang, Giovanni De Micheli, Ernesto Sanchez, and Matteo Sonza Reorda. “A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors.” ACM Journal on Emerging Technologies in Computing Systems, 2016, 1–13. https://doi.org/10.1145/2988234.
LibreCat
| DOI
2015 | Journal Article | LibreCat-ID: 10770
Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, and Giovanni De Micheli. “From Defect Analysis to Gate-Level Fault Modeling of Controllable-Polarity Silicon Nanowires.” IEEE Transactions on Nanotechnology 14, no. 6 (2015): 1117–26. https://doi.org/10.1109/TNANO.2015.2482359.
LibreCat
| DOI
2015 | Conference Paper | LibreCat-ID: 10771
Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, Jian Zhang, Giovanni De Micheli, Eduardo Sanchez, and Matteo Sonza Reorda. “On the Design of a Fault Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors.” In 2015 IEEE Computer Society Annual Symposium on VLSI, 491–96. IEEE, 2015. https://doi.org/10.1109/ISVLSI.2015.13.
LibreCat
| DOI
2015 | Conference Paper | LibreCat-ID: 10772
Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, and Giovanni De Micheli. “Fault Modeling in Controllable Polarity Silicon Nanowire Circuits.” In Proceedings of the 2015 Design, Automation & Test in Europe Conference \& Exhibition, 453–58. EDA Consortium, 2015. https://doi.org/10.7873/DATE.2015.0428.
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