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165 Publications
1993 | Conference Paper | LibreCat-ID: 13015
An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers
S. Venkataraman, J. Rajski, S. Hellebrand, S. Tarnick, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD’93), IEEE, 1993.
LibreCat
| DOI
S. Venkataraman, J. Rajski, S. Hellebrand, S. Tarnick, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD’93), IEEE, 1993.
1992 | Report | LibreCat-ID: 13023
Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, Institut National Polytechnique de Grenoble, Grenoble, France, 1992.
LibreCat
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, Institut National Polytechnique de Grenoble, Grenoble, France, 1992.
1992 | Misc | LibreCat-ID: 13076
Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, IEEE Design for Testability Workshop, Vail, CO, USA, 1992.
LibreCat
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, IEEE Design for Testability Workshop, Vail, CO, USA, 1992.
1992 | Misc | LibreCat-ID: 13080
Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, Workshop on New Directions for Testing, Montreal, Canada, 1992.
LibreCat
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, Workshop on New Directions for Testing, Montreal, Canada, 1992.
1992 | Journal Article | LibreCat-ID: 13017
The Pseudoexhaustive Test of Sequential Circuits
H.-J. Wunderlich, S. Hellebrand, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 11 (1992) 26–33.
LibreCat
| DOI
H.-J. Wunderlich, S. Hellebrand, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 11 (1992) 26–33.
1992 | Conference Paper | LibreCat-ID: 13016
Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: IEEE International Test Conference (ITC’92), IEEE, Baltimore, MD, USA, 1992, pp. 120–129.
LibreCat
| DOI
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: IEEE International Test Conference (ITC’92), IEEE, Baltimore, MD, USA, 1992, pp. 120–129.
1991 | Book | LibreCat-ID: 13034
Synthese vollständig testbarer Schaltungen
S. Hellebrand, Synthese Vollständig Testbarer Schaltungen, Verlag Düsseldorf: VDI Verlag, Verlag Düsseldorf: VDI Verlag, 1991.
LibreCat
S. Hellebrand, Synthese Vollständig Testbarer Schaltungen, Verlag Düsseldorf: VDI Verlag, Verlag Düsseldorf: VDI Verlag, 1991.
1990 | Misc | LibreCat-ID: 13103
Generating Pseudo-Exhaustive Vectors for External Testing
S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, Generating Pseudo-Exhaustive Vectors for External Testing, IEEE Design for Testability Workshop, Vail, CO, USA, 1990.
LibreCat
S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, Generating Pseudo-Exhaustive Vectors for External Testing, IEEE Design for Testability Workshop, Vail, CO, USA, 1990.
1990 | Conference Paper | LibreCat-ID: 13018
Tools and Devices Supporting the Pseudo-Exhaustive Test
S. Hellebrand, H.-J. Wunderlich, in: European Design Automation Conference (EDAC’90), IEEE, Glasgow, UK, 1990, pp. 13–17.
LibreCat
| DOI
S. Hellebrand, H.-J. Wunderlich, in: European Design Automation Conference (EDAC’90), IEEE, Glasgow, UK, 1990, pp. 13–17.
1990 | Conference Paper | LibreCat-ID: 13019
Generating Pseudo-Exhaustive Vectors for External Testing
S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.
LibreCat
| DOI
S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.