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32 Publications
2020 | Book Review | LibreCat-ID: 21294 | 
Hagengruber R. Review Hagengruber Le Ru Émilie Du Châtelet Philosophe . H-France Net. 2020;158.
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2020 | Journal Article | LibreCat-ID: 33299 |
Hahn CA. Informationskompetenz durch E-Learning? Durch Lernvideos nach Literatur suchen. die hochschullehre. 2020;(6).
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2020 | Book Review | LibreCat-ID: 51816
Schmitt M. Rezension zu: Bernardo Bátiz-Lazo: Cash and Dash. How ATMs and Computers Changed Banking. Vierteljahrschrift für Sozial- und Wirtschaftsgeschichte. 2020;107(4):541–543.
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2019 | Journal Article | LibreCat-ID: 18125
Mildorf J. Narratives of Vicarious Experience in Oral History Interviews with Craft Artists. Journal of Pragmatics. 2019;152:103-112.
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2016 | Book | LibreCat-ID: 27390
Schlegel-Matthies K. Zwischen Wissenschaft und Lebenswelt. Entwicklung, Stand und Zukunftsperspektiven haushaltsbezogener Bildung. Vol 10.; 2016.
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2016 | Journal Article | LibreCat-ID: 15732
Mirhosseini H, Kiss J, Roma G, Felser C. Reducing the Schottky barrier height at the MoSe2/Mo(110) interface in thin-film solar cells: Insights from first-principles calculations. Thin Solid Films. 2016:143-147. doi:10.1016/j.tsf.2016.03.053
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2014 | Journal Article | LibreCat-ID: 20924
Ebbert C, Alissawi N, Somsen C, et al. Spectroelectrochemical and morphological studies of the ageing of silver nanoparticles embedded in ultra-thin perfluorinated sputter deposited films. Thin Solid Films. 2014:161-167. doi:10.1016/j.tsf.2014.10.054
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2011 | Journal Article | LibreCat-ID: 4379
Garralaga Rojas E, Terheiden B, Plagwitz H, et al. Lift-off of mesoporous layers by electrochemical etching on Si (100) substrates with miscut of 6° off towards (111). Thin Solid Films. 2011;520(1):606-609. doi:10.1016/j.tsf.2011.07.063
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2011 | Journal Article | LibreCat-ID: 22598
de los Arcos de Pedro MT, Cwik S, Milanov AP, et al. Influence of process parameters on the crystallinity, morphology and composition of tungsten oxide-based thin films grown by metalorganic chemical vapor deposition. Thin Solid Films. Published online 2011:11-16. doi:10.1016/j.tsf.2011.12.007
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2011 | Journal Article | LibreCat-ID: 22606
Lahrood AR, de los Arcos de Pedro MT, Prenzel M, von Keudell A, Winter J. X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films. Thin Solid Films. Published online 2011:1625-1630. doi:10.1016/j.tsf.2011.07.040
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