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55 Publications
2020 | Journal Article | LibreCat-ID: 22056
K. J. Spychala et al., “Nonlinear focal mapping of ferroelectric domain walls in LiNbO3: Analysis of the SHG microscopy contrast mechanism,” Journal of Applied Physics, Art. no. 234102, 2020, doi: 10.1063/5.0025284.
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| DOI
2020 | Journal Article | LibreCat-ID: 47955
J. Zhao, M. Rüsing, M. Roeper, L. M. Eng, and S. Mookherjea, “Poling thin-film x-cut lithium niobate for quasi-phase matching with sub-micrometer periodicity,” Journal of Applied Physics, vol. 127, no. 19, Art. no. 193104, 2020, doi: 10.1063/1.5143266.
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2019 | Journal Article | LibreCat-ID: 47951 |
M. Rüsing, J. Zhao, and S. Mookherjea, “Second harmonic microscopy of poled x-cut thin film lithium niobate: Understanding the contrast mechanism,” Journal of Applied Physics, vol. 126, no. 11, Art. no. 114105, 2019, doi: 10.1063/1.5113727.
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2017 | Journal Article | LibreCat-ID: 22569
V. Layes, S. Monje, C. Corbella, V. Schulz-von der Gathen, A. von Keudell, and M. T. de los Arcos de Pedro, “Composite targets in HiPIMS plasmas: Correlation of in-vacuum XPS characterization and optical plasma diagnostics,” Journal of Applied Physics, Art. no. 171912, 2017, doi: 10.1063/1.4977820.
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2016 | Journal Article | LibreCat-ID: 4239
M. Rüsing, C. Eigner, P. Mackwitz, G. Berth, C. Silberhorn, and A. Zrenner, “Identification of ferroelectric domain structure sensitive phonon modes in potassium titanyl phosphate: A fundamental study,” Journal of Applied Physics, vol. 119, no. 4, Art. no. 044103, 2016, doi: 10.1063/1.4940964.
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2013 | Journal Article | LibreCat-ID: 23643
J. Will et al., “Oxygen diffusivity in silicon derived from dynamical X-ray diffraction,” Journal of Applied Physics, vol. 7, p. 073508, 2013, doi: 10.1063/1.4792747.
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2013 | Journal Article | LibreCat-ID: 39715
G. Nordendorf et al., “Hysteresis and memory factor of the Kerr effect in blue phases,” Journal of Applied Physics, vol. 114, no. 17, Art. no. 173104, 2013, doi: 10.1063/1.4828477.
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2012 | Journal Article | LibreCat-ID: 22603
M. Prenzel, M. T. de los Arcos de Pedro, A. Kortmann, J. Winter, and A. von Keudell, “Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films,” Journal of Applied Physics, Art. no. 103306, 2012, doi: 10.1063/1.4767383.
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