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5 Publications


2025 | Journal Article | LibreCat-ID: 58178
J. K. N. Lindner and C. Zietlow, “An applied noise model for low-loss EELS maps,” Ultramicroscopy, Art. no. 114101, 2025, doi: 10.1016/j.ultramic.2024.114101.
LibreCat | DOI
 

2020 | Journal Article | LibreCat-ID: 20892
J. Bürger, T. Riedl, and J. K. N. Lindner, “Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images,” Ultramicroscopy, 2020.
LibreCat | DOI
 

2020 | Journal Article | LibreCat-ID: 34088
J. Bürger, T. Riedl, and J. Lindner, “Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images,” Ultramicroscopy, vol. 219, Art. no. 113118, 2020, doi: 10.1016/j.ultramic.2020.113118.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 8772
M. Versen, B. Klehn, U. Kunze, D. Reuter, and A. . Wieck, “Nanoscale devices fabricated by direct machining of GaAs with an atomic force microscope,” Ultramicroscopy, pp. 159–163, 2002.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 8773
S. Skaberna, M. Versen, B. Klehn, U. Kunze, D. Reuter, and A. D. Wieck, “Fabrication of a quantum point contact by the dynamic plowing technique and wet-chemical etching,” Ultramicroscopy, pp. 153–157, 2002.
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