Learning Realistic Mutations: Bug Creation for Neural Bug Detectors

C. Richter, H. Wehrheim, in: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 2022, pp. 162–173.

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Conference Paper | English
Author
Richter, Cedric; Wehrheim, Heike
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Proceedings Title
2022 IEEE Conference on Software Testing, Verification and Validation (ICST)
Page
162-173
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Richter C, Wehrheim H. Learning Realistic Mutations: Bug Creation for Neural Bug Detectors. In: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST). ; 2022:162-173. doi:10.1109/ICST53961.2022.00027
Richter, C., & Wehrheim, H. (2022). Learning Realistic Mutations: Bug Creation for Neural Bug Detectors. 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 162–173. https://doi.org/10.1109/ICST53961.2022.00027
@inproceedings{Richter_Wehrheim_2022, title={Learning Realistic Mutations: Bug Creation for Neural Bug Detectors}, DOI={10.1109/ICST53961.2022.00027}, booktitle={2022 IEEE Conference on Software Testing, Verification and Validation (ICST)}, author={Richter, Cedric and Wehrheim, Heike}, year={2022}, pages={162–173} }
Richter, Cedric, and Heike Wehrheim. “Learning Realistic Mutations: Bug Creation for Neural Bug Detectors.” In 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 162–73, 2022. https://doi.org/10.1109/ICST53961.2022.00027.
C. Richter and H. Wehrheim, “Learning Realistic Mutations: Bug Creation for Neural Bug Detectors,” in 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 2022, pp. 162–173, doi: 10.1109/ICST53961.2022.00027.
Richter, Cedric, and Heike Wehrheim. “Learning Realistic Mutations: Bug Creation for Neural Bug Detectors.” 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 2022, pp. 162–73, doi:10.1109/ICST53961.2022.00027.

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