Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance
S. Buschjager, J.-J. Chen, K.-H. Chen, M. Gunzel, C. Hakert, K. Morik, R. Novkin, L. Pfahler, M. Yayla, in: 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), IEEE, 2021.
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Buschjager, Sebastian;
Chen, Jian-Jia;
Chen, Kuan-Hsun;
Gunzel, Mario;
Hakert, Christian;
Morik, Katharina;
Novkin, Rodion;
Pfahler, Lukas;
Yayla, Mikail
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2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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Buschjager S, Chen J-J, Chen K-H, et al. Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance. In: 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE; 2021. doi:10.23919/date51398.2021.9473918
Buschjager, S., Chen, J.-J., Chen, K.-H., Gunzel, M., Hakert, C., Morik, K., Novkin, R., Pfahler, L., & Yayla, M. (2021). Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance. 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). https://doi.org/10.23919/date51398.2021.9473918
@inproceedings{Buschjager_Chen_Chen_Gunzel_Hakert_Morik_Novkin_Pfahler_Yayla_2021, title={Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance}, DOI={10.23919/date51398.2021.9473918}, booktitle={2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)}, publisher={IEEE}, author={Buschjager, Sebastian and Chen, Jian-Jia and Chen, Kuan-Hsun and Gunzel, Mario and Hakert, Christian and Morik, Katharina and Novkin, Rodion and Pfahler, Lukas and Yayla, Mikail}, year={2021} }
Buschjager, Sebastian, Jian-Jia Chen, Kuan-Hsun Chen, Mario Gunzel, Christian Hakert, Katharina Morik, Rodion Novkin, Lukas Pfahler, and Mikail Yayla. “Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance.” In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 2021. https://doi.org/10.23919/date51398.2021.9473918.
S. Buschjager et al., “Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance,” 2021, doi: 10.23919/date51398.2021.9473918.
Buschjager, Sebastian, et al. “Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance.” 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), IEEE, 2021, doi:10.23919/date51398.2021.9473918.
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