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22 Publications
2016 | Journal Article | LibreCat-ID: 10769
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, and G. De Micheli, “Efficient Statistical Parameter Selection for Nonlinear Modeling of Process/Performance Variation,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. PP, no. 99, pp. 1–1, 2016.
LibreCat
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2016 | Journal Article | LibreCat-ID: 15879
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, J. Zhang, G. D. Micheli, E. Sanchez, and M. S. Reorda, “A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors,” ACM Journal on Emerging Technologies in Computing Systems, pp. 1–13, 2016.
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2015 | Conference Paper | LibreCat-ID: 10771
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, J. Zhang, G. De Micheli, E. Sanchez, and M. S. Reorda, “On the design of a fault tolerant ripple-carry adder with controllable-polarity transistors,” in 2015 IEEE Computer Society Annual Symposium on VLSI, 2015, pp. 491–496.
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2014 | Conference Paper | LibreCat-ID: 10773
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, and G. De Micheli, “Fast process variation analysis in nano-scaled technologies using column-wise sparse parameter selection,” in 2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), 2014, pp. 163–168.
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2013 | Conference Paper | LibreCat-ID: 10774
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, and G. De Micheli, “A fast TCAD-based methodology for Variation analysis of emerging nano-devices,” in 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2013, pp. 83–88.
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2009 | Conference Paper | LibreCat-ID: 10777
H. Ghasemzadeh Mohammadi, S. G. Miremadi, and A. Ejlali, “Signature Self Checking (SSC): A Low-Cost Reliable Control Logic for Pipelined Microprocessors,” in Dependable Computing (PRDC), 2009 IEEE Pacific Rim International Symposium on, 2009, pp. 252–255.
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2008 | Conference Paper | LibreCat-ID: 10778
H. Ghasemzadeh Mohammadi, H. Tabkhi, S. G. Miremadi, and A. Ejlali, “A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic,” in 2008 International Conference on Microelectronics, 2008, pp. 444–447.
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