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25 Publications
2024 | Conference Paper | LibreCat-ID: 52743
Hellebrand S, Sadeghi-Kohan S, Wunderlich H-J. Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle. In: International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024. ; :1.
LibreCat
2024 | Misc | LibreCat-ID: 50284
Stiballe A, Reimer JD, Sadeghi-Kohan S, Hellebrand S. Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression. 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024; 2024.
LibreCat
2024 | Misc | LibreCat-ID: 51799
Ustimova M, Sadeghi-Kohan S, Hellebrand S. Crosstalk-Aware Simulation of Interconnects Using Artificial Neural Networks. 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024; 2024.
LibreCat
2023 | Conference Paper | LibreCat-ID: 46738
Sadeghi-Kohan S, Reimer JD, Hellebrand S, Wunderlich H-J. Optimizing the Streaming of Sensor Data with Approximate Communication. In: IEEE Asian Test Symposium (ATS’23), October 2023. ; 2023.
LibreCat
2023 | Journal Article | LibreCat-ID: 46264
Sadeghi-Kohan S, Hellebrand S, Wunderlich H-J. Workload-Aware Periodic Interconnect BIST. IEEE Design &Test. Published online 2023:1-1. doi:10.1109/mdat.2023.3298849
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2023 | Misc | LibreCat-ID: 35204
Ghazal A, Sadeghi-Kohan S, Reimer JD, Hellebrand S. On Cryptography Effects on Interconnect Reliability. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023; 2023.
LibreCat
2023 | Conference Paper | LibreCat-ID: 41875
Badran A, Sadeghi-Kohan S, Reimer JD, Hellebrand S. Approximate Computing: Balancing Performance, Power, Reliability, and Safety. In: 28th IEEE European Test Symposium (ETS’23), May 2023. ; 2023.
LibreCat
2023 | Conference Paper | LibreCat-ID: 46739
Sadeghi-Kohan S, Hellebrand S, Wunderlich H-J. Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication. In: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W). IEEE; 2023. doi:10.1109/dsn-w58399.2023.00056
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2022 | Journal Article | LibreCat-ID: 29351
Sadeghi-Kohan S, Hellebrand S, Wunderlich H-J. Stress-Aware Periodic Test of Interconnects. Journal of Electronic Testing. Published online 2022. doi:10.1007/s10836-021-05979-5
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2022 | Misc | LibreCat-ID: 29890
Sadeghi-Kohan S, Hellebrand S, Wunderlich H-J. EM-Aware Interconnect BIST. European Workshop on Silicon Lifecycle Management, March 18, 2022; 2022.
LibreCat
2020 | Conference Paper | LibreCat-ID: 19422
Sprenger A, Sadeghi-Kohan S, Reimer JD, Hellebrand S. Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020. ; 2020.
LibreCat
2020 | Misc | LibreCat-ID: 15419
Sadeghi-Kohan S, Hellebrand S. Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects. 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020; 2020.
LibreCat
2020 | Conference Paper | LibreCat-ID: 29200
Sadeghi-Kohan S, Hellebrand S. Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects. In: 38th IEEE VLSI Test Symposium (VTS). IEEE; 2020. doi:10.1109/vts48691.2020.9107591
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2018 | Conference Paper | LibreCat-ID: 29460
Rezaeizadeh Rookerd R, Sadeghi-Kohan S, Navabi Z. Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture. In: Proceedings of the 2018 on Great Lakes Symposium on VLSI. ACM; 2018. doi:10.1145/3194554.3194599
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2018 | Conference Paper | LibreCat-ID: 29459
Sadeghi-Kohan S, Vafaei A, Navabi Z. Near-Optimal Node Selection Procedure for Aging Monitor Placement. In: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS). IEEE; 2018. doi:10.1109/iolts.2018.8474120
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2017 | Journal Article | LibreCat-ID: 29462
Sadeghi-Kohan S, Kamal M, Navabi Z. Self-Adjusting Monitor for Measuring Aging Rate and Advancement. IEEE Transactions on Emerging Topics in Computing. 2017;8(3):627-641. doi:10.1109/tetc.2017.2771441
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2017 | Conference Paper | LibreCat-ID: 29463
Jenihhin M, Kamkin A, Navabi Z, Sadeghi-Kohan S. Universal mitigation of NBTI-induced aging by design randomization. In: 2016 IEEE East-West Design & Test Symposium (EWDTS). IEEE; 2017. doi:10.1109/ewdts.2016.7807635
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2015 | Conference Paper | LibreCat-ID: 29465
Sadeghi-Kohan S, Kamran A, Forooghifar F, Navabi Z. Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation. In: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE; 2015. doi:10.1109/dtis.2015.7127373
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2015 | Conference Paper | LibreCat-ID: 29466
Sadeghi-Kohan S, Kamal M, McNeil J, Prinetto P, Navabi Z. Online self adjusting progressive age monitoring of timing variations. In: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE; 2015. doi:10.1109/dtis.2015.7127368
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2014 | Journal Article | LibreCat-ID: 46266
Alizadeh B, Behnam P, Sadeghi-Kohan S. A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs. IEEE Transactions on Computers. Published online 2014:1-1. doi:10.1109/tc.2014.2329687
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