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84 Publications
1997 | Conference Paper | LibreCat-ID: 13009
STARBIST: Scan Autocorrelated Random Pattern Generation
K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, J. Rajski, in: 34th ACM/IEEE Design Automation Conference (DAC’97), IEEE, Anaheim, CA, USA, 1997.
LibreCat
| DOI
K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, J. Rajski, in: 34th ACM/IEEE Design Automation Conference (DAC’97), IEEE, Anaheim, CA, USA, 1997.
1996 | Conference Paper | LibreCat-ID: 13010
Mixed-Mode BIST Using Embedded Processors
S. Hellebrand, H.-J. Wunderlich, A. Hertwig, in: IEEE International Test Conference (ITC’96), IEEE, Washington, DC, USA, 1996, pp. 195–204.
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S. Hellebrand, H.-J. Wunderlich, A. Hertwig, in: IEEE International Test Conference (ITC’96), IEEE, Washington, DC, USA, 1996, pp. 195–204.
1995 | Conference Paper | LibreCat-ID: 13012
Pattern Generation for a Deterministic BIST Scheme
S. Hellebrand, B. Reeb, S. Tarnick, H.-J. Wunderlich, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), IEEE, San Jose, CA, USA, 1995, pp. 88–94.
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S. Hellebrand, B. Reeb, S. Tarnick, H.-J. Wunderlich, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), IEEE, San Jose, CA, USA, 1995, pp. 88–94.
1994 | Conference Paper | LibreCat-ID: 13014
An Efficient Procedure for the Synthesis of Fast Self-Testable Controller Structures
S. Hellebrand, H.-J. Wunderlich, in: ACM/IEEE International Conference on Computer-Aided Design (ICCAD’94), IEEE, San Jose, CA, USA, 1994, pp. 110–116.
LibreCat
| DOI
S. Hellebrand, H.-J. Wunderlich, in: ACM/IEEE International Conference on Computer-Aided Design (ICCAD’94), IEEE, San Jose, CA, USA, 1994, pp. 110–116.
1994 | Conference Paper | LibreCat-ID: 13059
Synthese schneller selbsttestbarer Steuerwerke
S. Hellebrand, H.-J. Wunderlich, in: Tagungsband Der GI/GME/ITG-Fachtagung \& Rechnergestützter Entwurf Und Architektur Mikroelektronischer Systeme, Oberwiesenthal, Informatik Xpress 4, TU Chemnitz Zwickau, Germany, 1994, pp. 3–11.
LibreCat
S. Hellebrand, H.-J. Wunderlich, in: Tagungsband Der GI/GME/ITG-Fachtagung \& Rechnergestützter Entwurf Und Architektur Mikroelektronischer Systeme, Oberwiesenthal, Informatik Xpress 4, TU Chemnitz Zwickau, Germany, 1994, pp. 3–11.
1994 | Conference Paper | LibreCat-ID: 13013
Synthesis of Self-Testable Controllers
S. Hellebrand, H.-J. Wunderlich, in: European Design and Test Conference (EDAC/ETC/EUROASIC), Paris, France, 1994, pp. 580–585.
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S. Hellebrand, H.-J. Wunderlich, in: European Design and Test Conference (EDAC/ETC/EUROASIC), Paris, France, 1994, pp. 580–585.
1993 | Conference Paper | LibreCat-ID: 13015
An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers
S. Venkataraman, J. Rajski, S. Hellebrand, S. Tarnick, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD’93), IEEE, 1993.
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S. Venkataraman, J. Rajski, S. Hellebrand, S. Tarnick, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD’93), IEEE, 1993.
1992 | Conference Paper | LibreCat-ID: 13016
Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: IEEE International Test Conference (ITC’92), IEEE, Baltimore, MD, USA, 1992, pp. 120–129.
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S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: IEEE International Test Conference (ITC’92), IEEE, Baltimore, MD, USA, 1992, pp. 120–129.
1990 | Conference Paper | LibreCat-ID: 13018
Tools and Devices Supporting the Pseudo-Exhaustive Test
S. Hellebrand, H.-J. Wunderlich, in: European Design Automation Conference (EDAC’90), IEEE, Glasgow, UK, 1990, pp. 13–17.
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| DOI
S. Hellebrand, H.-J. Wunderlich, in: European Design Automation Conference (EDAC’90), IEEE, Glasgow, UK, 1990, pp. 13–17.
1990 | Conference Paper | LibreCat-ID: 13019
Generating Pseudo-Exhaustive Vectors for External Testing
S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.
LibreCat
| DOI
S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.