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151 Publications
1998 | Journal Article | LibreCat-ID: 13064
Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications
S. Hellebrand, A. Hertwig, H.-J. Wunderlich, IEEE Design and Test 15 (1998) 36–41.
LibreCat
S. Hellebrand, A. Hertwig, H.-J. Wunderlich, IEEE Design and Test 15 (1998) 36–41.
1998 | Conference Paper | LibreCat-ID: 13007
Fast Self-Recovering Controllers
A. Hertwig, S. Hellebrand, H.-J. Wunderlich, in: 16th IEEE VLSI Test Symposium (VTS’98), IEEE, Monterey, CA, USA, 1998, pp. 296–302.
LibreCat
| DOI
A. Hertwig, S. Hellebrand, H.-J. Wunderlich, in: 16th IEEE VLSI Test Symposium (VTS’98), IEEE, Monterey, CA, USA, 1998, pp. 296–302.
1998 | Conference Paper | LibreCat-ID: 13008
Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs
S. Hellebrand, H.-J. Wunderlich, V. N. Yarmolik, in: Design Automation and Test in Europe (DATE’98), Paris, France, 1998, pp. 173–179.
LibreCat
| DOI
S. Hellebrand, H.-J. Wunderlich, V. N. Yarmolik, in: Design Automation and Test in Europe (DATE’98), Paris, France, 1998, pp. 173–179.
1998 | Conference Paper | LibreCat-ID: 13063
New Transparent RAM BIST Based on Self-Adjusting Output Data Compression
V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, H.-J. Wunderlich, in: Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), Szczyrk, Poland, 1998, pp. 27–33.
LibreCat
V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, H.-J. Wunderlich, in: Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), Szczyrk, Poland, 1998, pp. 27–33.
1997 | Misc | LibreCat-ID: 13089
STARBIST: Scan Autocorrelated Random Pattern Generation
K.-H. Tsai, S. Hellebrand, J. Rajski, M. Marek-Sadowska, STARBIST: Scan Autocorrelated Random Pattern Generation, 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.
LibreCat
K.-H. Tsai, S. Hellebrand, J. Rajski, M. Marek-Sadowska, STARBIST: Scan Autocorrelated Random Pattern Generation, 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.
1997 | Misc | LibreCat-ID: 13090
Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications
A. Hertwig, S. Hellebrand, H.-J. Wunderlich, Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, 3rd IEEE International On-Line Testing Workshop, Crete, Greece, 1997.
LibreCat
A. Hertwig, S. Hellebrand, H.-J. Wunderlich, Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, 3rd IEEE International On-Line Testing Workshop, Crete, Greece, 1997.
1997 | Conference Paper | LibreCat-ID: 13009
STARBIST: Scan Autocorrelated Random Pattern Generation
K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, J. Rajski, in: 34th ACM/IEEE Design Automation Conference (DAC’97), IEEE, Anaheim, CA, USA, 1997.
LibreCat
| DOI
K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, J. Rajski, in: 34th ACM/IEEE Design Automation Conference (DAC’97), IEEE, Anaheim, CA, USA, 1997.
1996 | Misc | LibreCat-ID: 13087
Using Embedded Processors for BIST
S. Hellebrand, H.-J. Wunderlich, Using Embedded Processors for BIST, 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1996.
LibreCat
S. Hellebrand, H.-J. Wunderlich, Using Embedded Processors for BIST, 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1996.
1996 | Misc | LibreCat-ID: 13088
Mixed-Mode BIST Using Embedded Processors
S. Hellebrand, H.-J. Wunderlich, A. Hertwig, Mixed-Mode BIST Using Embedded Processors, 2nd IEEE International On-Line Testing Workshop. Biarritz, France, 1996.
LibreCat
S. Hellebrand, H.-J. Wunderlich, A. Hertwig, Mixed-Mode BIST Using Embedded Processors, 2nd IEEE International On-Line Testing Workshop. Biarritz, France, 1996.
1996 | Conference Paper | LibreCat-ID: 13010
Mixed-Mode BIST Using Embedded Processors
S. Hellebrand, H.-J. Wunderlich, A. Hertwig, in: IEEE International Test Conference (ITC’96), IEEE, Washington, DC, USA, 1996, pp. 195–204.
LibreCat
| DOI
S. Hellebrand, H.-J. Wunderlich, A. Hertwig, in: IEEE International Test Conference (ITC’96), IEEE, Washington, DC, USA, 1996, pp. 195–204.