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2876 Publications


2010 | Conference Paper | LibreCat-ID: 12988
Reusing NoC-Infrastructure for Test Data Compression
V. Froese, R. Ibers, S. Hellebrand, in: 28th IEEE VLSI Test Symposium (VTS’10), IEEE, Santa Cruz, CA, USA, 2010, pp. 227–231.
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2010 | Conference Paper | LibreCat-ID: 13049
Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), Chicago, IL, USA, 2010.
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2010 | Conference Paper | LibreCat-ID: 13050
Robuster Selbsttest mit extremer Kompaktierung
T. Indlekofer, M. Schnittger, S. Hellebrand, in: 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” Wildbad Kreuth, Germany, 2010, pp. 17–24.
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2010 | Conference Paper | LibreCat-ID: 47603 LibreCat
 

2010 | Conference Paper | LibreCat-ID: 47604
Virtual Science Fair - neu in Deutschland
G. Jonas-Ahrend, in: 2010.
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2010 | Conference Paper | LibreCat-ID: 47611
Ein eLearningkurs zur Entwicklung mediengestützter Physikaufgaben
H. Theyßen, G. Jonas-Ahrend, K. Neumann, B. Priemer, S. Uhlmann, in: 2010.
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2010 | Journal Article | LibreCat-ID: 11892 | OA
Online Diarization of Streaming Audio-Visual Data for Smart Environments
J. Schmalenstroeer, R. Haeb-Umbach, IEEE Journal of Selected Topics in Signal Processing 4 (2010) 845–856.
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2010 | Book (Editor) | LibreCat-ID: 53582
Proceedings of the 1st Workshop on Model Based Engineering for Embedded Systems Design
S. Gerard, W. Müller, L. Rioux, B. Selic, eds., Proceedings of the 1st Workshop on Model Based Engineering for Embedded Systems Design, Dresden, Germany, 2010.
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2010 | Book (Editor) | LibreCat-ID: 53581
Proceedings of 13th Design Automation and Test in Europe Conference & Exhibition (DATE)
G. De Micheli, W. Müller, eds., Proceedings of 13th Design Automation and Test in Europe Conference & Exhibition  (DATE), IEEE Press, Dresden, Germany, 2010.
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2010 | Journal Article | LibreCat-ID: 53909 LibreCat | Download (ext.)
 

2010 | Journal Article | LibreCat-ID: 53907 LibreCat | Download (ext.)
 

2010 | Journal Article | LibreCat-ID: 53911 LibreCat | Download (ext.)
 

2010 | Conference Paper | LibreCat-ID: 47616 LibreCat
 

2010 | Journal Article | LibreCat-ID: 38484
Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats
T. Pfau, R. Noé, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS 16 (2010) 1210–1216.
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2010 | Conference Paper | LibreCat-ID: 38466
Realtime 16-QAM Transmission with Coherent Digital Receiver
A. Al-Bermani, C. Woerdehoff, S. Hoffmann, K. Puntsri, T. Pfau, U. Rueckert, R. Noé, in: 2010 15TH OPTOELECTRONICS AND COMMUNICATIONS CONFERENCE (OECC), 2010, p. 152+.
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2010 | Conference Paper | LibreCat-ID: 38460
Performance of Modified Decision-Directed Polarization Control/Demultiplex Algorithm in Coherent QAM Receiver
M. El-Darawy, T. Pfau, C. Woerdehoff, R. Noé, in: 2010 CONFERENCE ON OPTICAL FIBER COMMUNICATION OFC COLLOCATED NATIONAL FIBER OPTIC ENGINEERS CONFERENCE OFC-NFOEC, 2010.
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2010 | Journal Article | LibreCat-ID: 38448
Hardware-Efficient Phase Estimation for Digital Coherent Transmission With Star Constellation QAM
S. Hoffmann, C. Woerdehoff, A. Al-Bermani, M. El-Darawy, K. Puntsri, U. Rueckert, R. Noé, IEEE PHOTONICS JOURNAL 2 (2010) 174–180.
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2010 | Journal Article | LibreCat-ID: 38451
40-krad/s Polarization Tracking in 200-Gb/s PDM-RZ-DQPSK Transmission Over 430 km
B. Koch, R. Noé, V. Mirvoda, D. Sandel, V. Filsinger, K. Puntsri, IEEE PHOTONICS TECHNOLOGY LETTERS 22 (2010) 613–615.
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2010 | Conference Paper | LibreCat-ID: 38436
200-Gb/s, 430-km PDM-RZ-DQPSK (4 bit/symbol) Transmission with 10 krad/s Endless Polarization Tracking
B. Koch, R. Noé, D. Sandel, V. Mirvoda, V. Filsinger, K. Puntsri, in: 2010 CONFERENCE ON OPTICAL FIBER COMMUNICATION OFC COLLOCATED NATIONAL FIBER OPTIC ENGINEERS CONFERENCE OFC-NFOEC, 2010.
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2010 | Journal Article | LibreCat-ID: 38432
Real-Time Phase-Noise-Tolerant 2.5-Gb/s Synchronous 16-QAM Transmission
A. Al-Bermani, C. Woerdehoff, S. Hoffmann, D. Sandel, U. Rueckert, R. Noé, IEEE PHOTONICS TECHNOLOGY LETTERS 22 (2010) 1823–1825.
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