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165 Publications
2017 | Misc | LibreCat-ID: 13078
X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz
M. Kampmann, S. Hellebrand, X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz, 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
LibreCat
M. Kampmann, S. Hellebrand, X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz, 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
2017 | Conference Paper | LibreCat-ID: 10576
Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test
M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017.
LibreCat
| DOI
M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017.
2017 | Journal Article | LibreCat-ID: 29462
Self-Adjusting Monitor for Measuring Aging Rate and Advancement
S. Sadeghi-Kohan, M. Kamal, Z. Navabi, IEEE Transactions on Emerging Topics in Computing 8 (2017) 627–641.
LibreCat
| DOI
S. Sadeghi-Kohan, M. Kamal, Z. Navabi, IEEE Transactions on Emerging Topics in Computing 8 (2017) 627–641.
2017 | Conference Paper | LibreCat-ID: 29463
Universal mitigation of NBTI-induced aging by design randomization
M. Jenihhin, A. Kamkin, Z. Navabi, S. Sadeghi-Kohan, in: 2016 IEEE East-West Design & Test Symposium (EWDTS), IEEE, 2017.
LibreCat
| DOI
M. Jenihhin, A. Kamkin, Z. Navabi, S. Sadeghi-Kohan, in: 2016 IEEE East-West Design & Test Symposium (EWDTS), IEEE, 2017.
2016 | Conference Paper | LibreCat-ID: 12975
X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test
M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS’16), IEEE, Hiroshima, Japan, 2016, pp. 1–6.
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| DOI
M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS’16), IEEE, Hiroshima, Japan, 2016, pp. 1–6.
2015 | Conference Paper | LibreCat-ID: 12976
Optimized Selection of Frequencies for Faster-Than-at-Speed Test
M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India, 2015, pp. 109–114.
LibreCat
| DOI
M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India, 2015, pp. 109–114.
2015 | Journal Article | LibreCat-ID: 13056
A High Performance SEU Tolerant Latch
Z. Huang, H. Liang, S. Hellebrand, Journal of Electronic Testing - Theory and Applications (JETTA) 31 (2015) 349–359.
LibreCat
Z. Huang, H. Liang, S. Hellebrand, Journal of Electronic Testing - Theory and Applications (JETTA) 31 (2015) 349–359.
2015 | Misc | LibreCat-ID: 13077
Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler
S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, H.-J. Wunderlich, Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler, 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
LibreCat
S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, H.-J. Wunderlich, Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler, 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
2015 | Conference Paper | LibreCat-ID: 29465
Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation
S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015.
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| DOI
S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015.
2015 | Conference Paper | LibreCat-ID: 29466
Online self adjusting progressive age monitoring of timing variations
S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015.
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| DOI
S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015.
2014 | Conference Paper | LibreCat-ID: 12977
FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects
S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’14), IEEE, Seattle, Washington, USA, 2014.
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| DOI
S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’14), IEEE, Seattle, Washington, USA, 2014.
2014 | Journal Article | LibreCat-ID: 13054
SAT-Based ATPG beyond Stuck-at Fault Testing
S. Hellebrand, H.-J. Wunderlich, DeGruyter Journal on Information Technology (It) 56 (2014) 165–172.
LibreCat
S. Hellebrand, H.-J. Wunderlich, DeGruyter Journal on Information Technology (It) 56 (2014) 165–172.
2014 | Journal Article | LibreCat-ID: 13055
Adaptive Bayesian Diagnosis of Intermittent Faults
L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) 30 (2014) 527–540.
LibreCat
L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) 30 (2014) 527–540.
2014 | Journal Article | LibreCat-ID: 46266
A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs
B. Alizadeh, P. Behnam, S. Sadeghi-Kohan, IEEE Transactions on Computers (2014) 1–1.
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| DOI
B. Alizadeh, P. Behnam, S. Sadeghi-Kohan, IEEE Transactions on Computers (2014) 1–1.
2014 | Conference Paper | LibreCat-ID: 46268
An off-line MDSI interconnect BIST incorporated in BS 1149.1
M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.
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| DOI
M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.
2014 | Conference Paper | LibreCat-ID: 46267
Improving polynomial datapath debugging with HEDs
S. Sadeghi-Kohan, P. Behnam, B. Alizadeh, M. Fujita, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.
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S. Sadeghi-Kohan, P. Behnam, B. Alizadeh, M. Fujita, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.
2013 | Conference Paper | LibreCat-ID: 12979
Analyzing and Quantifying Fault Tolerance Properties
S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW’13), IEEE, Cordoba, Argentina, 2013.
LibreCat
| DOI
S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW’13), IEEE, Cordoba, Argentina, 2013.
2013 | Misc | LibreCat-ID: 13075
Adaptive Test and Diagnosis of Intermittent Faults
A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, Adaptive Test and Diagnosis of Intermittent Faults, 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
LibreCat
A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, Adaptive Test and Diagnosis of Intermittent Faults, 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
2013 | Conference Paper | LibreCat-ID: 46271
BS 1149.1 extensions for an online interconnect fault detection and recovery
S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, Z. Navabi, in: 2012 IEEE International Test Conference, IEEE, 2013.
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| DOI
S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, Z. Navabi, in: 2012 IEEE International Test Conference, IEEE, 2013.
2013 | Conference Paper | LibreCat-ID: 46270
A new structure for interconnect offline testing
S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, Z. Navabi, in: East-West Design & Test Symposium (EWDTS 2013), IEEE, 2013.
LibreCat
| DOI
S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, Z. Navabi, in: East-West Design & Test Symposium (EWDTS 2013), IEEE, 2013.