Please note that LibreCat no longer supports Internet Explorer versions 8 or 9 (or earlier).
We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.
1 Publication
2011 | Conference Paper | LibreCat-ID: 4546
Frers, T., Hett, T., Hilleringmann, U., Berth, G., Widhalm, A., & Zrenner, A. (2011). Characterization of SiON integrated waveguides via FTIR and AFM measurements. In 2011 Semiconductor Conference Dresden. Dresden, Germany: IEEE. https://doi.org/10.1109/scd.2011.6068744
LibreCat
| DOI