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89 Publications
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2009 | Journal Article | LibreCat-ID: 29678
Ksenzov D, Grigorian S, Hendel S, et al. Reflection of femtosecond pulses from soft X-ray free-electron laser by periodical multilayers. physica status solidi (a). 2009;206(8):1875-1879. doi:10.1002/pssa.200881585
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2008 | Journal Article | LibreCat-ID: 41277
Rill C, Bauer M, Bertagnolli H, Kickelbick G. Microemulsion approach to neodymium, europium, and ytterbium oxide/hydroxide colloids—Effects of precursors and preparation parameters on particle size and crystallinity. Journal of Colloid and Interface Science. 2008;325(1):179-186. doi:10.1016/j.jcis.2008.05.008
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2008 | Journal Article | LibreCat-ID: 39556
Diekmann T, Pannemann C, Hilleringmann U. Dielectric layers for organic field effect transistors as gate dielectric and surface passivation. physica status solidi (a). 2008;205(3):564-577. doi:10.1002/pssa.200723406
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2007 | Journal Article | LibreCat-ID: 39969
Kitzerow H-S, Lorenz A, Matthias H. Tuneable photonic crystals obtained by liquid crystal infiltration. physica status solidi (a). 2007;204(11):3754-3767. doi:10.1002/pssa.200776404
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2007 | Journal Article | LibreCat-ID: 39759
Kitzerow H-S, Lorenz A, Matthias H. Tuneable photonic crystals obtained by liquid crystal infiltration. physica status solidi (a). 2007;204(11):3754-3767. doi:10.1002/pssa.200776404
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2007 | Journal Article | LibreCat-ID: 41280
Bauer M, Bertagnolli H. The Amplitude Reduction Factor and the Cumulant Expansion Method: Crucial Factors in the Structural Analysis of Alkoxide Precursors in Solution. The Journal of Physical Chemistry B. 2007;111(49):13756-13764. doi:10.1021/jp076386i
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2007 | Journal Article | LibreCat-ID: 42002
Lages S, Schweins R, Huber K. Temperature-Induced Collapse of Alkaline Earth Cation−Polyacrylate Anion Complexes. The Journal of Physical Chemistry B. 2007;111(35):10431-10437. doi:10.1021/jp068258k
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2007 | Journal Article | LibreCat-ID: 39563
Jiang J, Hilleringmann U, Shui X. Electro-thermo-mechanical analytical modeling of multilayer cantilever microactuator. Sensors and Actuators A: Physical. 2007;137(2):302-307. doi:10.1016/j.sna.2007.03.012
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2006 | Journal Article | LibreCat-ID: 35352
Frank C, Strey R, Schmidt C, Stubenrauch C. Coexisting lamellar phases in water–oil–surfactant systems induced by the addition of an amphiphilic block copolymer. Journal of Colloid and Interface Science. 2006;312(1):76-86. doi:10.1016/j.jcis.2006.06.043
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2004 | Journal Article | LibreCat-ID: 42018
Kramer T, Scholz S, Maskos M, Huber K. Colloid–polymer mixtures in solution with refractive index matched acrylate colloids. Journal of Colloid and Interface Science. 2004;279(2):447-457. doi:10.1016/j.jcis.2004.06.102
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2003 | Journal Article | LibreCat-ID: 35360
Angelico R, Burgemeister D, Ceglie A, Olsson U, Palazzo G, Schmidt C. Deuterium NMR Study of Slow Relaxation Dynamics in a Polymer-like Micelles System after Flow-Induced Orientation. The Journal of Physical Chemistry B. 2003;107(38):10325-10328. doi:10.1021/jp0356259
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2003 | Journal Article | LibreCat-ID: 39851
Pannemann Ch, Diekmann T, Hilleringmann U. Nanometer scale organic thin film transistors with Pentacene. Microelectronic Engineering. 2003;67-68:845-852. doi:10.1016/s0167-9317(03)00146-1
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2002 | Journal Article | LibreCat-ID: 39912
Schönstein I, Müller J, Hilleringmann U, Goser K. Characterization of submicron NMOS devices due to visible light emission. Microelectronic Engineering. 2002;21(1-4):363-366. doi:10.1016/0167-9317(93)90092-j
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2002 | Journal Article | LibreCat-ID: 39914
Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
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2002 | Journal Article | LibreCat-ID: 39899
Horstmann JT, Hilleringmann U, Goser K. Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique. Microelectronic Engineering. 2002;30(1-4):431-434. doi:10.1016/0167-9317(95)00280-4
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2002 | Journal Article | LibreCat-ID: 39882
Mankowski V, Hilleringmann U, Schumacher K. A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV. Microelectronic Engineering. 2002;53(1-4):525-528. doi:10.1016/s0167-9317(00)00370-1
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2002 | Journal Article | LibreCat-ID: 39879
Horstmann JT, Hilleringmann U, Goser K. 1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique. Microelectronic Engineering. 2002;53(1-4):213-216. doi:10.1016/s0167-9317(00)00299-9
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2002 | Journal Article | LibreCat-ID: 39919
Hilleringmann U, Knospe K, Heite C, Schumacher K, Goser K. A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits. Microelectronic Engineering. 2002;15(1-4):289-292. doi:10.1016/0167-9317(91)90231-2
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2002 | Journal Article | LibreCat-ID: 39920
Soennecken A, Hilleringmann U, Goser K. Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering. 2002;15(1-4):633-636. doi:10.1016/0167-9317(91)90299-s
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2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
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