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251 Publications
2002 | Journal Article | LibreCat-ID: 39912
Schönstein I, Müller J, Hilleringmann U, Goser K. Characterization of submicron NMOS devices due to visible light emission. Microelectronic Engineering. 2002;21(1-4):363-366. doi:10.1016/0167-9317(93)90092-j
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2002 | Journal Article | LibreCat-ID: 39914
Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
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2002 | Journal Article | LibreCat-ID: 39899
Horstmann JT, Hilleringmann U, Goser K. Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique. Microelectronic Engineering. 2002;30(1-4):431-434. doi:10.1016/0167-9317(95)00280-4
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2002 | Journal Article | LibreCat-ID: 39882
Mankowski V, Hilleringmann U, Schumacher K. A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV. Microelectronic Engineering. 2002;53(1-4):525-528. doi:10.1016/s0167-9317(00)00370-1
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2002 | Journal Article | LibreCat-ID: 39879
Horstmann JT, Hilleringmann U, Goser K. 1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique. Microelectronic Engineering. 2002;53(1-4):213-216. doi:10.1016/s0167-9317(00)00299-9
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2002 | Journal Article | LibreCat-ID: 39919
Hilleringmann U, Knospe K, Heite C, Schumacher K, Goser K. A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits. Microelectronic Engineering. 2002;15(1-4):289-292. doi:10.1016/0167-9317(91)90231-2
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2002 | Journal Article | LibreCat-ID: 39920
Soennecken A, Hilleringmann U, Goser K. Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering. 2002;15(1-4):633-636. doi:10.1016/0167-9317(91)90299-s
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2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
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2002 | Journal Article | LibreCat-ID: 39916
Adams S, Hilleringmann U, Goser K. CMOS compatible micromachining by dry silicon-etching techniques. Microelectronic Engineering. 2002;19(1-4):191-194. doi:10.1016/0167-9317(92)90420-v
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2002 | Journal Article | LibreCat-ID: 39889
Mankowski V, Hilleringmann U, Schumacher K. 12 kV low current cascaded light triggered switch on one silicon chip. Microelectronic Engineering. 2002;46(1-4):413-417. doi:10.1016/s0167-9317(99)00122-7
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2002 | Journal Article | LibreCat-ID: 39886
Wirth G, Hilleringmann U, Horstmann JT, Goser K. Mesoscopic transport phenomena in ultrashort channel MOSFETs. Solid-State Electronics. 2002;43(7):1245-1250. doi:10.1016/s0038-1101(99)00060-x
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2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann U, Vieregge T, Horstmann JT. A structure definition technique for 25 nm lines of silicon and related materials. Microelectronic Engineering. 2002;53(1-4):569-572. doi:10.1016/s0167-9317(00)00380-4
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2002 | Journal Article | LibreCat-ID: 45432
Mahnken R, Stein E. The identification of parameters for visco-plastic models via finite-element methods and gradient methods. Modelling and Simulation in Materials Science and Engineering. 2002;2(3A):597-616. doi:10.1088/0965-0393/2/3a/013
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2001 | Journal Article | LibreCat-ID: 35365
Thiele T, Berret J-F, Müller S, Schmidt C. Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics. Journal of Rheology. 2001;45(1):29-48. doi:10.1122/1.1332387
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2000 | Journal Article | LibreCat-ID: 40083
Glossmann J, Hoischen A, Roder T, Kitzerow H-S. Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers. Ferroelectrics. 2000;243(1):95-106. doi:10.1080/00150190008008011
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2000 | Journal Article | LibreCat-ID: 42051
Inglés SE, Katzenstein A, Schlenker W, Huber K. Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering. Langmuir. 2000;16(7):3010-3018. doi:10.1021/la9903649
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1999 | Journal Article | LibreCat-ID: 35370
Schmidt G, Müller S, Schmidt C, Richtering W. Rheo-optical investigations of lyotropic mesophases of polymeric surfactants. Rheologica Acta. 1999;38(6):486-494. doi:10.1007/s003970050201
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1999 | Conference (Editor) | LibreCat-ID: 35368
Schmidt C, Navard P, eds. EURORHEO 99-1 in Sophia-Antipolis, France. Vol 38. Springer Science and Business Media LLC; 1999:485-485. doi:10.1007/s003970050200
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1999 | Journal Article | LibreCat-ID: 35371
Müller S, Börschig C, Gronski W, Schmidt C, Roux D. Shear-Induced States of Orientation of the Lamellar Phase of C12E4/Water. Langmuir. 1999;15(22):7558-7564. doi:10.1021/la9904105
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1999 | Journal Article | LibreCat-ID: 35372
Quijada-Garrido I, Siebert H, Becker P, Friedrich C, Schmidt C. Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters. Rheologica Acta. 1999;38(6):495-502. doi:10.1007/s003970050202
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