2015 | Konferenzbeitrag | LibreCat-ID: 24289
Müller, Wolfgang, Liang Wu, Christoph Scheytt, Markus Becker, and Sven Schoenberg. “On the Correlation of HW Faults and SW Errors.” In Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), edited by Daniel Mueller-Gritschneder, Wolfgang Müller, and Subhasish Mitra. Amsterdam, Netherland, 2015.
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