On the Correlation of HW Faults and SW Errors

W. Müller, L. Wu, C. Scheytt, M. Becker, S. Schoenberg, in: D. Mueller-Gritschneder, W. Müller, S. Mitra (Eds.), Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), Amsterdam, Netherland, 2015.

Download
No fulltext has been uploaded.
Conference Paper | English
Author
Editor
; ;
Publishing Year
Proceedings Title
Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)
LibreCat-ID

Cite this

Müller W, Wu L, Scheytt C, Becker M, Schoenberg S. On the Correlation of HW Faults and SW Errors. In: Mueller-Gritschneder D, Müller W, Mitra S, eds. Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014). ; 2015.
Müller, W., Wu, L., Scheytt, C., Becker, M., & Schoenberg, S. (2015). On the Correlation of HW Faults and SW Errors. In D. Mueller-Gritschneder, W. Müller, & S. Mitra (Eds.), Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014).
@inproceedings{Müller_Wu_Scheytt_Becker_Schoenberg_2015, place={Amsterdam, Netherland}, title={On the Correlation of HW Faults and SW Errors}, booktitle={Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)}, author={Müller, Wolfgang and Wu, Liang and Scheytt, Christoph and Becker, Markus and Schoenberg, Sven}, editor={Mueller-Gritschneder, Daniel and Müller, Wolfgang and Mitra, Subhasish}, year={2015} }
Müller, Wolfgang, Liang Wu, Christoph Scheytt, Markus Becker, and Sven Schoenberg. “On the Correlation of HW Faults and SW Errors.” In Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), edited by Daniel Mueller-Gritschneder, Wolfgang Müller, and Subhasish Mitra. Amsterdam, Netherland, 2015.
W. Müller, L. Wu, C. Scheytt, M. Becker, and S. Schoenberg, “On the Correlation of HW Faults and SW Errors,” in Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), 2015.
Müller, Wolfgang, et al. “On the Correlation of HW Faults and SW Errors.” Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), edited by Daniel Mueller-Gritschneder et al., 2015.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar