Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits

B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: {40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}, {IEEE}, Chicago, IL, USA, 2010.

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{40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W'10)}
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Becker B, Hellebrand S, Polian I, Straube B, Vermeiren W, Wunderlich H-J. Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In: {40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}. Chicago, IL, USA: {IEEE}; 2010. doi:10.1109/dsnw.2010.5542612
Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2010). Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In {40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}. Chicago, IL, USA: {IEEE}. https://doi.org/10.1109/dsnw.2010.5542612
@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, DOI={10.1109/dsnw.2010.5542612}, booktitle={{40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}}, publisher={{IEEE}}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }
Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In {40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}. Chicago, IL, USA: {IEEE}, 2010. https://doi.org/10.1109/dsnw.2010.5542612.
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” in {40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}, 2010.
Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” {40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}, {IEEE}, 2010, doi:10.1109/dsnw.2010.5542612.

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