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10 Publications
2021 | Journal Article | LibreCat-ID: 29210
L. Wu and J. C. Scheytt, “Analysis and Design of a Charge Sampler With 70-GHz 1-dB Bandwidth in 130-nm SiGe BiCMOS,” IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 68, no. 9, pp. 3668–3681, 2021, doi: 10.1109/tcsi.2021.3094428.
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2021 | Dissertation | LibreCat-ID: 52664
L. Wu, Ultrabreitbandige Sampler in SiGe-BiCMOS-Technologie für Analog-Digital-Wandler mit zeitversetzter Abtastung, vol. 402. 2021.
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2020 | Conference Paper | LibreCat-ID: 24021
L. Wu, M. Weizel, and C. Scheytt, “Above 60 GHz Bandwidth 10 GS/s Sampling Rate Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology,” 2020, doi: 10.1109/ISCAS45731.2020.9180947.
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2019 | Conference Paper | LibreCat-ID: 24049
L. Wu, M. Weizel, and C. Scheytt, “70 GHz Large-signal Bandwidth Sampler Using Current-mode Integrate-and-Hold Circuit in 130 nm SiGe BiCMOS Technology,” Singapore , 2019, doi: 10.1109/APMC46564.2019.9038239.
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2019 | Conference Paper | LibreCat-ID: 24052
L. Wu, M. Weizel, and C. Scheytt, “A 70 GHz Small-signal Bandwidth 40 GS/s Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology,” 2019, doi: 10.1109/ICECS46596.2019.8965046.
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2018 | Conference Paper | LibreCat-ID: 24196
L. Wu, M. K. Hussain, S. Abughannam, W. Müller, C. Scheytt, and W. Ecker, “Analog fault simulation automation at schematic level with random sampling techniques,” 2018, doi: 10.1109/DTIS.2018.8368549.
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2018 | Patent | LibreCat-ID: 24198
C. Scheytt and L. Wu, “Integrier‐ und Halte‐Schaltung .” 2018.
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2017 | Conference Paper | LibreCat-ID: 24223
L. Wu, S. Abughannam, W. Müller, C. Scheytt, and W. Ecker, “SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study,” in 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), 2017, p. 68.
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2016 | Conference Paper | LibreCat-ID: 24263
S. Abughannam, L. Wu, W. Müller, C. Scheytt, W. Ecker, and C. Novello, “Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study,” 2016.
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2015 | Conference Paper | LibreCat-ID: 24289
W. Müller, L. Wu, C. Scheytt, M. Becker, and S. Schoenberg, “On the Correlation of HW Faults and SW Errors,” in Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), 2015.
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