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10 Publications


2021 | Journal Article | LibreCat-ID: 29210
Wu, Liang, and J. Christoph Scheytt. “Analysis and Design of a Charge Sampler With 70-GHz 1-DB Bandwidth in 130-Nm SiGe BiCMOS.” IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 68, no. 9, Institute of Electrical and Electronics Engineers (IEEE), 2021, pp. 3668–81, doi:10.1109/tcsi.2021.3094428.
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2021 | Dissertation | LibreCat-ID: 52664
Wu, Liang. Ultrabreitbandige Sampler in SiGe-BiCMOS-Technologie Für Analog-Digital-Wandler Mit Zeitversetzter Abtastung. 2021.
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2020 | Conference Paper | LibreCat-ID: 24021
Wu, Liang, et al. “Above 60 GHz Bandwidth 10 GS/s Sampling Rate Track-and-Hold Amplifier in 130 Nm SiGe BiCMOS Technology.” 2020 IEEE International Symposium on Circuits and Systems (ISCAS), IEEE, 2020, doi:10.1109/ISCAS45731.2020.9180947.
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2019 | Conference Paper | LibreCat-ID: 24049
Wu, Liang, et al. “70 GHz Large-Signal Bandwidth Sampler Using Current-Mode Integrate-and-Hold Circuit in 130 Nm SiGe BiCMOS Technology.” Asia-Pacific Microwave Conference (APMC), 2019, doi:10.1109/APMC46564.2019.9038239.
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2019 | Conference Paper | LibreCat-ID: 24052
Wu, Liang, et al. “A 70 GHz Small-Signal Bandwidth 40 GS/s Track-and-Hold Amplifier in 130 Nm SiGe BiCMOS Technology.” 26th IEEE International Conference on Electronics Circuits and Systems (ICECS), 2019, doi:10.1109/ICECS46596.2019.8965046.
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2018 | Conference Paper | LibreCat-ID: 24196
Wu, Liang, et al. “Analog Fault Simulation Automation at Schematic Level with Random Sampling Techniques.” 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) , IEEE, 2018, doi:10.1109/DTIS.2018.8368549.
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2018 | Patent | LibreCat-ID: 24198
Scheytt, Christoph, and Liang Wu. Integrier‐ Und Halte‐Schaltung . 2018.
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2017 | Conference Paper | LibreCat-ID: 24223
Wu, Liang, et al. “SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study.” 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), 2017, p. 68.
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2016 | Conference Paper | LibreCat-ID: 24263
Abughannam, Saed, et al. “Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study.” Analog 2016 - VDE, 2016.
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2015 | Conference Paper | LibreCat-ID: 24289
Müller, Wolfgang, et al. “On the Correlation of HW Faults and SW Errors.” Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), edited by Daniel Mueller-Gritschneder et al., 2015.
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