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2800 Publications
2010 | Conference Paper | LibreCat-ID: 13051
Hunger M, Hellebrand S. Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz. In: 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Wildbad Kreuth, Germany; 2010:81-88.
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2010 | Misc | LibreCat-ID: 13073
Hellebrand S. Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180; 2010.
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2010 | Conference Paper | LibreCat-ID: 30321
Schafmeister F, Wang X, Grote T, Ide P. Scalable Multi Phase Interleaved Boundary Mode PFC Concept enabling Energy- and Cost Efficient PSUs in the kW-Range. In: Proc. IEEE International Symposium on Industrial Electronics (ISIE). IEEE; 2010:3831-3835.
LibreCat
2010 | Conference Paper | LibreCat-ID: 30516
Paiz C, Hagemeyer J, Pohl C, et al. FPGA-based realization of self-optimizing drive-controllers. In: 2009 35th Annual Conference of IEEE Industrial Electronics. IEEE; 2010. doi:10.1109/iecon.2009.5415402
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| DOI
2010 | Conference Paper | LibreCat-ID: 30523
Romaus C, Gathmann K, Böcker J. Optimal energy management for a hybrid energy storage system for electric vehicles based on Stochastic Dynamic Programming. In: 2010 IEEE Vehicle Power and Propulsion Conference. IEEE; 2010. doi:10.1109/vppc.2010.5728979
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| DOI
2010 | Conference Paper | LibreCat-ID: 30524
Pohlenz D, Böcker J. Efficiency improvement of an IPMSM using Maximum Efficiency operating strategy. In: Proceedings of 14th International Power Electronics and Motion Control Conference EPE-PEMC 2010. IEEE; 2010. doi:10.1109/epepemc.2010.5606831
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| DOI
2010 | Conference Paper | LibreCat-ID: 30525
Specht A, Böcker J. Observer for the rotor temperature of IPMSM. In: Proceedings of 14th International Power Electronics and Motion Control Conference EPE-PEMC 2010. IEEE; 2010. doi:10.1109/epepemc.2010.5606818
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 30522
Boxnick S, Klopfer S, Romaus C, Klopper B. Multiobjective search for the management of a hybrid energy storage system. In: 2010 8th IEEE International Conference on Industrial Informatics. IEEE; 2010. doi:10.1109/indin.2010.5549487
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 30526
Schneider T, Schulte C, Mathapati S, Böcker J. Energy transfer with doubly-excited switched reluctance drive. In: SPEEDAM 2010. IEEE; 2010. doi:10.1109/speedam.2010.5545160
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| DOI
2010 | Conference Paper | LibreCat-ID: 30521
Cao Z, Hu M, Fröhleke N, Böcker J. Modeling and Control Design for a Very Low-Frequency High-Voltage Test System. In: IEEE TRANSACTIONS ON POWER ELECTRONICS 25(2). ; 2010. doi:10.1109/TPEL.2009.2033600
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| DOI
2010 | Journal Article | LibreCat-ID: 30536
Grotstollen H. Optimal Design of Motor and Gear for Drives With High Acceleration by Consideration of Torque–Speed and Torque–Acceleration Product. IEEE Transactions on Industry Applications. 2010;47(1):144-152. doi:10.1109/tia.2010.2091479
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| DOI
2010 | Dissertation | LibreCat-ID: 30530
Knoke T. Entwurf und Betrieb hybrid-elektrischer Fahrzeugantriebe am Beispiel von Abfallsammelfahrzeugen.; 2010.
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2010 | Dissertation | LibreCat-ID: 30529
Meyer M. Wirkungsgradoptimierte Regelung hoch ausgenutzter Permanent-Synchronmaschinen im Antriebsstrang von Automobilen.; 2010.
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2010 | Dissertation | LibreCat-ID: 30528
Li R. Power Supplies for High-Power Piezoelectric Ultrasonic Motor.; 2010.
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2010 | Conference Paper | LibreCat-ID: 12983
Hopsch F, Becker B, Hellebrand S, et al. Variation-Aware Fault Modeling. In: 19th IEEE Asian Test Symposium (ATS’10). IEEE; 2010:87-93. doi:10.1109/ats.2010.24
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| DOI
2010 | Conference Paper | LibreCat-ID: 12985
Indlekofer T, Schnittger M, Hellebrand S. Efficient Test Response Compaction for Robust BIST Using Parity Sequences. In: 28th IEEE International Conference on Computer Design (ICCD’10). IEEE; 2010:480-485. doi:10.1109/iccd.2010.5647648
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| DOI
2010 | Conference Paper | LibreCat-ID: 12986
Hunger M, Hellebrand S. The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. In: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10). IEEE; 2010:101-108. doi:10.1109/dft.2010.19
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 12988
Froese V, Ibers R, Hellebrand S. Reusing NoC-Infrastructure for Test Data Compression. In: 28th IEEE VLSI Test Symposium (VTS’10). IEEE; 2010:227-231. doi:10.1109/vts.2010.5469570
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| DOI
2010 | Conference Paper | LibreCat-ID: 13049
Becker B, Hellebrand S, Polian I, Straube B, Vermeiren W, Wunderlich H-J. Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In: 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). ; 2010.
LibreCat
2010 | Conference Paper | LibreCat-ID: 13050
Indlekofer T, Schnittger M, Hellebrand S. Robuster Selbsttest mit extremer Kompaktierung. In: 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” ; 2010:17-24.
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