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165 Publications
2004 | Conference Paper | LibreCat-ID: 13001
A. Wuertenberger, C. S. Tautermann, and S. Hellebrand, “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections,” in IEEE International Test Conference (ITC’04), 2004, pp. 926–935, doi: 10.1109/test.2004.1387357.
LibreCat
| DOI
2003 | Misc | LibreCat-ID: 13098
R. Breu, S. Hellebrand, and M. Welzl, Experiences from Teaching Software Development in a Java Environment. Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia, 2003.
LibreCat
2003 | Conference Paper | LibreCat-ID: 13002
A. Wuertenberger, C. S. Tautermann, and S. Hellebrand, “A Hybrid Coding Strategy for Optimized Test Data Compression,” in IEEE International Test Conference (ITC’03), 2003, pp. 451–459, doi: 10.1109/test.2003.1270870.
LibreCat
| DOI
2002 | Misc | LibreCat-ID: 13097
S. Hellebrand and A. Wuertenberger, Alternating Run-Length Coding: A Technique for Improved Test Data Compression. IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.
LibreCat
2002 | Journal Article | LibreCat-ID: 13003
S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, and V. N. Yarmolik, “Efficient Online and Offline Testing of Embedded DRAMs,” IEEE Transactions on Computers, vol. 51, no. 7, pp. 801–809, 2002, doi: 10.1109/tc.2002.1017700.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 13069
S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST,” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 18, no. 2, pp. 157–168, 2002.
LibreCat
2002 | Journal Article | LibreCat-ID: 13070
H. Liang, S. Hellebrand, and H.-J. Wunderlich, “A Mixed-Mode BIST Scheme Based on Folding Compression,” Journal on Computer Science and Technology, vol. 17, no. 2, pp. 203–212, 2002.
LibreCat
2001 | Misc | LibreCat-ID: 13096
H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden, 2001.
LibreCat
2001 | Conference Paper | LibreCat-ID: 13004
H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST,” in IEEE International Test Conference (ITC’01), 2001, pp. 894–902, doi: 10.1109/test.2001.966712.
LibreCat
| DOI
2001 | Journal Article | LibreCat-ID: 13047
H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, “Deterministic BIST Scheme Based on Reseeding of Folding Counters,” Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan), vol. 38, no. 8, p. 931, 2001.
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