Please note that LibreCat no longer supports Internet Explorer versions 8 or 9 (or earlier).

We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.

165 Publications


2004 | Conference Paper | LibreCat-ID: 13001
Data Compression for Multiple Scan Chains Using Dictionaries with Corrections
A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International Test Conference (ITC’04), IEEE, Charlotte, NC, USA, 2004, pp. 926–935.
LibreCat | DOI
 

2003 | Misc | LibreCat-ID: 13098
Experiences from Teaching Software Development in a Java Environment
R. Breu, S. Hellebrand, M. Welzl, Experiences from Teaching Software Development in a Java Environment, Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia, 2003.
LibreCat
 

2003 | Conference Paper | LibreCat-ID: 13002
A Hybrid Coding Strategy for Optimized Test Data Compression
A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International Test Conference (ITC’03), IEEE, Charlotte, NC, USA, 2003, pp. 451–459.
LibreCat | DOI
 

2002 | Misc | LibreCat-ID: 13097
Alternating Run-Length Coding: A Technique for Improved Test Data Compression
S. Hellebrand, A. Wuertenberger, Alternating Run-Length Coding: A Technique for Improved Test Data Compression, IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.
LibreCat
 

2002 | Journal Article | LibreCat-ID: 13003
Efficient Online and Offline Testing of Embedded DRAMs
S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, IEEE Transactions on Computers 51 (2002) 801–809.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 13069
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) 18 (2002) 157–168.
LibreCat
 

2002 | Journal Article | LibreCat-ID: 13070
A Mixed-Mode BIST Scheme Based on Folding Compression
H. Liang, S. Hellebrand, H.-J. Wunderlich, Journal on Computer Science and Technology 17 (2002) 203–212.
LibreCat
 

2001 | Misc | LibreCat-ID: 13096
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, IEEE European Test Workshop, Stockholm, Sweden, 2001.
LibreCat
 

2001 | Conference Paper | LibreCat-ID: 13004
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’01), IEEE, Baltimore, MD, USA, 2001, pp. 894–902.
LibreCat | DOI
 

2001 | Journal Article | LibreCat-ID: 13047
Deterministic BIST Scheme Based on Reseeding of Folding Counters
H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Journal of Computer Research and Development, (Jisuanji Yanjiu Yu Fazhan) 38 (2001) 931.
LibreCat
 

Filters and Search Terms

department=48

Search

Filter Publications

Display / Sort

Citation Style: Default

Export / Embed