Somayeh Sadeghi-Kohan

Datentechnik (DATE)
somayeh.sadeghi@uni-paderborn.de
ID
78614

25 Publications

Mark all

[25]
2024 | Conference Paper | LibreCat-ID: 52743
@inproceedings{Hellebrand_Sadeghi-Kohan_Wunderlich, title={Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle}, booktitle={International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024}, author={Hellebrand, Sybille and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim}, pages={1} }
LibreCat
 
[24]
2024 | Misc | LibreCat-ID: 50284
@book{Stiballe_Reimer_Sadeghi-Kohan_Hellebrand_2024, place={Darmstadt, Germany}, title={Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression}, publisher={37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024}, author={Stiballe, Alisa and Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2024} }
LibreCat
 
[23]
2024 | Misc | LibreCat-ID: 51799
@book{Ustimova_Sadeghi-Kohan_Hellebrand_2024, place={Darmstadt, Germany}, title={Crosstalk-Aware Simulation of Interconnects Using Artificial Neural Networks}, publisher={37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024}, author={Ustimova, Magdalina and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2024} }
LibreCat
 
[22]
2023 | Misc | LibreCat-ID: 35204
@book{Ghazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Erfurt, Germany}, title={On Cryptography Effects on Interconnect Reliability}, publisher={35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023}, author={Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }
LibreCat
 
[21]
2023 | Conference Paper | LibreCat-ID: 41875
@inproceedings{Badran_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Venice, Italy}, title={Approximate Computing: Balancing Performance, Power, Reliability, and Safety}, booktitle={28th IEEE European Test Symposium (ETS’23), May 2023}, author={Badran, Abdalrhman and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }
LibreCat
 
[20]
2023 | Conference Paper | LibreCat-ID: 46739
@inproceedings{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication}, DOI={10.1109/dsn-w58399.2023.00056}, booktitle={2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat | DOI
 
[19]
2023 | Conference Paper | LibreCat-ID: 46738
@inproceedings{Sadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place={Beijing, China}, title={Optimizing the Streaming of Sensor Data with Approximate Communication}, booktitle={IEEE Asian Test Symposium (ATS’23), October 2023}, author={Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
 
[18]
2023 | Journal Article | LibreCat-ID: 46264
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Workload-Aware Periodic Interconnect BIST}, DOI={10.1109/mdat.2023.3298849}, journal={IEEE Design &Test}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023}, pages={1–1} }
LibreCat | DOI | Download (ext.)
 
[17]
2022 | Journal Article | LibreCat-ID: 29351
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, title={Stress-Aware Periodic Test of Interconnects}, DOI={10.1007/s10836-021-05979-5}, journal={Journal of Electronic Testing}, publisher={Springer Science and Business Media LLC}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
LibreCat | DOI
 
[16]
2022 | Misc | LibreCat-ID: 29890
@book{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, place={Online}, title={EM-Aware Interconnect BIST}, publisher={European Workshop on Silicon Lifecycle Management, March 18, 2022}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
LibreCat
 
[15]
2020 | Conference Paper | LibreCat-ID: 19422
@inproceedings{Sprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place={Virtual Conference - Originally Frascati (Rome), Italy}, title={Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study}, booktitle={IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020}, author={Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2020} }
LibreCat
 
[14]
2020 | Misc | LibreCat-ID: 15419
@book{Sadeghi-Kohan_Hellebrand_2020, place={Ludwigsburg}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, publisher={32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }
LibreCat
 
[13]
2020 | Conference Paper | LibreCat-ID: 29200
@inproceedings{Sadeghi-Kohan_Hellebrand_2020, place={Virtual Conference - Originally San Diego, CA, USA}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, DOI={10.1109/vts48691.2020.9107591}, booktitle={38th IEEE VLSI Test Symposium (VTS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }
LibreCat | DOI
 
[12]
2018 | Conference Paper | LibreCat-ID: 29460
@inproceedings{Rezaeizadeh Rookerd_Sadeghi-Kohan_Navabi_2018, title={Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture}, DOI={10.1145/3194554.3194599}, booktitle={Proceedings of the 2018 on Great Lakes Symposium on VLSI}, publisher={ACM}, author={Rezaeizadeh Rookerd, Ramin and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2018} }
LibreCat | DOI
 
[11]
2018 | Conference Paper | LibreCat-ID: 29459
@inproceedings{Sadeghi-Kohan_Vafaei_Navabi_2018, title={Near-Optimal Node Selection Procedure for Aging Monitor Placement}, DOI={10.1109/iolts.2018.8474120}, booktitle={2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Vafaei, Arash and Navabi, Zainalabedin}, year={2018} }
LibreCat | DOI
 
[10]
2017 | Journal Article | LibreCat-ID: 29462
@article{Sadeghi-Kohan_Kamal_Navabi_2017, title={Self-Adjusting Monitor for Measuring Aging Rate and Advancement}, volume={8}, DOI={10.1109/tetc.2017.2771441}, number={3}, journal={IEEE Transactions on Emerging Topics in Computing}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Kamal, Mehdi and Navabi, Zainalabedin}, year={2017}, pages={627–641} }
LibreCat | DOI
 
[9]
2017 | Conference Paper | LibreCat-ID: 29463
@inproceedings{Jenihhin_Kamkin_Navabi_Sadeghi-Kohan_2017, title={Universal mitigation of NBTI-induced aging by design randomization}, DOI={10.1109/ewdts.2016.7807635}, booktitle={2016 IEEE East-West Design & Test Symposium (EWDTS)}, publisher={IEEE}, author={Jenihhin, Maksim and Kamkin, Alexander and Navabi, Zainalabedin and Sadeghi-Kohan, Somayeh}, year={2017} }
LibreCat | DOI
 
[8]
2015 | Conference Paper | LibreCat-ID: 29465
@inproceedings{Sadeghi-Kohan_Kamran_Forooghifar_Navabi_2015, title={Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation}, DOI={10.1109/dtis.2015.7127373}, booktitle={2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Kamran, Arezoo and Forooghifar, Farnaz and Navabi, Zainalabedin}, year={2015} }
LibreCat | DOI
 
[7]
2015 | Conference Paper | LibreCat-ID: 29466
@inproceedings{Sadeghi-Kohan_Kamal_McNeil_Prinetto_Navabi_2015, title={Online self adjusting progressive age monitoring of timing variations}, DOI={10.1109/dtis.2015.7127368}, booktitle={2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Kamal, Mehdi and McNeil, John and Prinetto, Paolo and Navabi, Zain}, year={2015} }
LibreCat | DOI
 
[6]
2014 | Journal Article | LibreCat-ID: 46266
@article{Alizadeh_Behnam_Sadeghi-Kohan_2014, title={A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs}, DOI={10.1109/tc.2014.2329687}, journal={IEEE Transactions on Computers}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Alizadeh, Bijan and Behnam, Payman and Sadeghi-Kohan, Somayeh}, year={2014}, pages={1–1} }
LibreCat | DOI
 
[5]
2014 | Conference Paper | LibreCat-ID: 46268
@inproceedings{Mohammadi_Sadeghi-Kohan_Masoumi_Navabi_2014, title={An off-line MDSI interconnect BIST incorporated in BS 1149.1}, DOI={10.1109/ets.2014.6847847}, booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Mohammadi, Marzieh and Sadeghi-Kohan, Somayeh and Masoumi, Nasser and Navabi, Zainalabedin}, year={2014} }
LibreCat | DOI
 
[4]
2014 | Conference Paper | LibreCat-ID: 46267
@inproceedings{Sadeghi-Kohan_Behnam_Alizadeh_Fujita_Navabi_2014, title={Improving polynomial datapath debugging with HEDs}, DOI={10.1109/ets.2014.6847797}, booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Behnam, Payman and Alizadeh, Bijan and Fujita, Masahiro and Navabi, Zainalabedin}, year={2014} }
LibreCat | DOI
 
[3]
2013 | Conference Paper | LibreCat-ID: 46271
@inproceedings{Sadeghi-Kohan_Namaki-Shoushtari_Javaheri_Navabi_2013, title={BS 1149.1 extensions for an online interconnect fault detection and recovery}, DOI={10.1109/test.2012.6401583}, booktitle={2012 IEEE International Test Conference}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin}, year={2013} }
LibreCat | DOI
 
[2]
2013 | Conference Paper | LibreCat-ID: 46270
@inproceedings{Sadeghi-Kohan_Keshavarz_Zokaee_Farahmandi_Navabi_2013, title={A new structure for interconnect offline testing}, DOI={10.1109/ewdts.2013.6673207}, booktitle={East-West Design & Test Symposium (EWDTS 2013)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Keshavarz, Shahrzad and Zokaee, Farzaneh and Farahmandi, Farimah and Navabi, Zainalabedin}, year={2013} }
LibreCat | DOI
 
[1]
2011 | Conference Paper | LibreCat-ID: 46272
@inproceedings{Kamran_Nemati_Sadeghi-Kohan_Navabi_2011, title={Virtual tester development using HDL/PLI}, DOI={10.1109/ewdts.2010.5742156}, booktitle={2010 East-West Design & Test Symposium (EWDTS)}, publisher={IEEE}, author={Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2011} }
LibreCat | DOI
 
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25 Publications

Mark all

[25]
2024 | Conference Paper | LibreCat-ID: 52743
@inproceedings{Hellebrand_Sadeghi-Kohan_Wunderlich, title={Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle}, booktitle={International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024}, author={Hellebrand, Sybille and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim}, pages={1} }
LibreCat
 
[24]
2024 | Misc | LibreCat-ID: 50284
@book{Stiballe_Reimer_Sadeghi-Kohan_Hellebrand_2024, place={Darmstadt, Germany}, title={Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression}, publisher={37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024}, author={Stiballe, Alisa and Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2024} }
LibreCat
 
[23]
2024 | Misc | LibreCat-ID: 51799
@book{Ustimova_Sadeghi-Kohan_Hellebrand_2024, place={Darmstadt, Germany}, title={Crosstalk-Aware Simulation of Interconnects Using Artificial Neural Networks}, publisher={37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024}, author={Ustimova, Magdalina and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2024} }
LibreCat
 
[22]
2023 | Misc | LibreCat-ID: 35204
@book{Ghazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Erfurt, Germany}, title={On Cryptography Effects on Interconnect Reliability}, publisher={35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023}, author={Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }
LibreCat
 
[21]
2023 | Conference Paper | LibreCat-ID: 41875
@inproceedings{Badran_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Venice, Italy}, title={Approximate Computing: Balancing Performance, Power, Reliability, and Safety}, booktitle={28th IEEE European Test Symposium (ETS’23), May 2023}, author={Badran, Abdalrhman and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }
LibreCat
 
[20]
2023 | Conference Paper | LibreCat-ID: 46739
@inproceedings{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication}, DOI={10.1109/dsn-w58399.2023.00056}, booktitle={2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat | DOI
 
[19]
2023 | Conference Paper | LibreCat-ID: 46738
@inproceedings{Sadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place={Beijing, China}, title={Optimizing the Streaming of Sensor Data with Approximate Communication}, booktitle={IEEE Asian Test Symposium (ATS’23), October 2023}, author={Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
 
[18]
2023 | Journal Article | LibreCat-ID: 46264
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Workload-Aware Periodic Interconnect BIST}, DOI={10.1109/mdat.2023.3298849}, journal={IEEE Design &Test}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023}, pages={1–1} }
LibreCat | DOI | Download (ext.)
 
[17]
2022 | Journal Article | LibreCat-ID: 29351
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, title={Stress-Aware Periodic Test of Interconnects}, DOI={10.1007/s10836-021-05979-5}, journal={Journal of Electronic Testing}, publisher={Springer Science and Business Media LLC}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
LibreCat | DOI
 
[16]
2022 | Misc | LibreCat-ID: 29890
@book{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, place={Online}, title={EM-Aware Interconnect BIST}, publisher={European Workshop on Silicon Lifecycle Management, March 18, 2022}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
LibreCat
 
[15]
2020 | Conference Paper | LibreCat-ID: 19422
@inproceedings{Sprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place={Virtual Conference - Originally Frascati (Rome), Italy}, title={Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study}, booktitle={IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020}, author={Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2020} }
LibreCat
 
[14]
2020 | Misc | LibreCat-ID: 15419
@book{Sadeghi-Kohan_Hellebrand_2020, place={Ludwigsburg}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, publisher={32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }
LibreCat
 
[13]
2020 | Conference Paper | LibreCat-ID: 29200
@inproceedings{Sadeghi-Kohan_Hellebrand_2020, place={Virtual Conference - Originally San Diego, CA, USA}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, DOI={10.1109/vts48691.2020.9107591}, booktitle={38th IEEE VLSI Test Symposium (VTS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }
LibreCat | DOI
 
[12]
2018 | Conference Paper | LibreCat-ID: 29460
@inproceedings{Rezaeizadeh Rookerd_Sadeghi-Kohan_Navabi_2018, title={Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture}, DOI={10.1145/3194554.3194599}, booktitle={Proceedings of the 2018 on Great Lakes Symposium on VLSI}, publisher={ACM}, author={Rezaeizadeh Rookerd, Ramin and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2018} }
LibreCat | DOI
 
[11]
2018 | Conference Paper | LibreCat-ID: 29459
@inproceedings{Sadeghi-Kohan_Vafaei_Navabi_2018, title={Near-Optimal Node Selection Procedure for Aging Monitor Placement}, DOI={10.1109/iolts.2018.8474120}, booktitle={2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Vafaei, Arash and Navabi, Zainalabedin}, year={2018} }
LibreCat | DOI
 
[10]
2017 | Journal Article | LibreCat-ID: 29462
@article{Sadeghi-Kohan_Kamal_Navabi_2017, title={Self-Adjusting Monitor for Measuring Aging Rate and Advancement}, volume={8}, DOI={10.1109/tetc.2017.2771441}, number={3}, journal={IEEE Transactions on Emerging Topics in Computing}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Kamal, Mehdi and Navabi, Zainalabedin}, year={2017}, pages={627–641} }
LibreCat | DOI
 
[9]
2017 | Conference Paper | LibreCat-ID: 29463
@inproceedings{Jenihhin_Kamkin_Navabi_Sadeghi-Kohan_2017, title={Universal mitigation of NBTI-induced aging by design randomization}, DOI={10.1109/ewdts.2016.7807635}, booktitle={2016 IEEE East-West Design & Test Symposium (EWDTS)}, publisher={IEEE}, author={Jenihhin, Maksim and Kamkin, Alexander and Navabi, Zainalabedin and Sadeghi-Kohan, Somayeh}, year={2017} }
LibreCat | DOI
 
[8]
2015 | Conference Paper | LibreCat-ID: 29465
@inproceedings{Sadeghi-Kohan_Kamran_Forooghifar_Navabi_2015, title={Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation}, DOI={10.1109/dtis.2015.7127373}, booktitle={2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Kamran, Arezoo and Forooghifar, Farnaz and Navabi, Zainalabedin}, year={2015} }
LibreCat | DOI
 
[7]
2015 | Conference Paper | LibreCat-ID: 29466
@inproceedings{Sadeghi-Kohan_Kamal_McNeil_Prinetto_Navabi_2015, title={Online self adjusting progressive age monitoring of timing variations}, DOI={10.1109/dtis.2015.7127368}, booktitle={2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Kamal, Mehdi and McNeil, John and Prinetto, Paolo and Navabi, Zain}, year={2015} }
LibreCat | DOI
 
[6]
2014 | Journal Article | LibreCat-ID: 46266
@article{Alizadeh_Behnam_Sadeghi-Kohan_2014, title={A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs}, DOI={10.1109/tc.2014.2329687}, journal={IEEE Transactions on Computers}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Alizadeh, Bijan and Behnam, Payman and Sadeghi-Kohan, Somayeh}, year={2014}, pages={1–1} }
LibreCat | DOI
 
[5]
2014 | Conference Paper | LibreCat-ID: 46268
@inproceedings{Mohammadi_Sadeghi-Kohan_Masoumi_Navabi_2014, title={An off-line MDSI interconnect BIST incorporated in BS 1149.1}, DOI={10.1109/ets.2014.6847847}, booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Mohammadi, Marzieh and Sadeghi-Kohan, Somayeh and Masoumi, Nasser and Navabi, Zainalabedin}, year={2014} }
LibreCat | DOI
 
[4]
2014 | Conference Paper | LibreCat-ID: 46267
@inproceedings{Sadeghi-Kohan_Behnam_Alizadeh_Fujita_Navabi_2014, title={Improving polynomial datapath debugging with HEDs}, DOI={10.1109/ets.2014.6847797}, booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Behnam, Payman and Alizadeh, Bijan and Fujita, Masahiro and Navabi, Zainalabedin}, year={2014} }
LibreCat | DOI
 
[3]
2013 | Conference Paper | LibreCat-ID: 46271
@inproceedings{Sadeghi-Kohan_Namaki-Shoushtari_Javaheri_Navabi_2013, title={BS 1149.1 extensions for an online interconnect fault detection and recovery}, DOI={10.1109/test.2012.6401583}, booktitle={2012 IEEE International Test Conference}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin}, year={2013} }
LibreCat | DOI
 
[2]
2013 | Conference Paper | LibreCat-ID: 46270
@inproceedings{Sadeghi-Kohan_Keshavarz_Zokaee_Farahmandi_Navabi_2013, title={A new structure for interconnect offline testing}, DOI={10.1109/ewdts.2013.6673207}, booktitle={East-West Design & Test Symposium (EWDTS 2013)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Keshavarz, Shahrzad and Zokaee, Farzaneh and Farahmandi, Farimah and Navabi, Zainalabedin}, year={2013} }
LibreCat | DOI
 
[1]
2011 | Conference Paper | LibreCat-ID: 46272
@inproceedings{Kamran_Nemati_Sadeghi-Kohan_Navabi_2011, title={Virtual tester development using HDL/PLI}, DOI={10.1109/ewdts.2010.5742156}, booktitle={2010 East-West Design & Test Symposium (EWDTS)}, publisher={IEEE}, author={Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2011} }
LibreCat | DOI
 
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