Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides
M. Hammer, S. Babel, H. Farheen, L. Padberg, J.C. Scheytt, C. Silberhorn, J. Förstner, Optics Express 32 (2024) 22878.
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TRR 142: TRR 142 - Maßgeschneiderte nichtlineare Photonik: Von grundlegenden Konzepten zu funktionellen Strukturen
TRR 142 - C11: TRR 142 - Kompakte Photonenpaar-Quelle mit ultraschnellen Modulatoren auf Basis von CMOS und LNOI (C11*)
TRR 142 - B06: TRR 142 - Ultraschnelle kohärente opto-elektronische Kontrolle eines photonischen Quantensystems (B06*)
PhoQC: PhoQC: Photonisches Quantencomputing
TRR 142 - C11: TRR 142 - Kompakte Photonenpaar-Quelle mit ultraschnellen Modulatoren auf Basis von CMOS und LNOI (C11*)
TRR 142 - B06: TRR 142 - Ultraschnelle kohärente opto-elektronische Kontrolle eines photonischen Quantensystems (B06*)
PhoQC: PhoQC: Photonisches Quantencomputing
Abstract
Samples of dielectric optical waveguides of rib or strip type in thin-film lithium niobate (TFLN) technology are characterized with respect to their optical loss using the Fabry-Pérot method. Attributing the losses mainly to sidewall roughness, we employ a simple perturbational procedure, based on rigorously computed mode profiles of idealized channels, to estimate the attenuation for waveguides with different cross sections. A single fit parameter suffices for an adequate modelling of the effect of the waveguide geometry on the loss levels.
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Journal Title
Optics Express
Volume
32
Issue
13
Page
22878
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Hammer M, Babel S, Farheen H, et al. Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides. Optics Express. 2024;32(13):22878. doi:10.1364/oe.521766
Hammer, M., Babel, S., Farheen, H., Padberg, L., Scheytt, J. C., Silberhorn, C., & Förstner, J. (2024). Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides. Optics Express, 32(13), 22878. https://doi.org/10.1364/oe.521766
@article{Hammer_Babel_Farheen_Padberg_Scheytt_Silberhorn_Förstner_2024, title={Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides}, volume={32}, DOI={10.1364/oe.521766}, number={13}, journal={Optics Express}, publisher={Optica Publishing Group}, author={Hammer, Manfred and Babel, Silia and Farheen, Henna and Padberg, Laura and Scheytt, J. Christoph and Silberhorn, Christine and Förstner, Jens}, year={2024}, pages={22878} }
Hammer, Manfred, Silia Babel, Henna Farheen, Laura Padberg, J. Christoph Scheytt, Christine Silberhorn, and Jens Förstner. “Estimation of Losses Caused by Sidewall Roughness in Thin-Film Lithium Niobate Rib and Strip Waveguides.” Optics Express 32, no. 13 (2024): 22878. https://doi.org/10.1364/oe.521766.
M. Hammer et al., “Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides,” Optics Express, vol. 32, no. 13, p. 22878, 2024, doi: 10.1364/oe.521766.
Hammer, Manfred, et al. “Estimation of Losses Caused by Sidewall Roughness in Thin-Film Lithium Niobate Rib and Strip Waveguides.” Optics Express, vol. 32, no. 13, Optica Publishing Group, 2024, p. 22878, doi:10.1364/oe.521766.
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