Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides

M. Hammer, S. Babel, H. Farheen, L. Padberg, J.C. Scheytt, C. Silberhorn, J. Förstner, Optics Express 32 (2024) 22878.

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Journal Article | Published | English
Abstract
Samples of dielectric optical waveguides of rib or strip type in thin-film lithium niobate (TFLN) technology are characterized with respect to their optical loss using the Fabry-Pérot method. Attributing the losses mainly to sidewall roughness, we employ a simple perturbational procedure, based on rigorously computed mode profiles of idealized channels, to estimate the attenuation for waveguides with different cross sections. A single fit parameter suffices for an adequate modelling of the effect of the waveguide geometry on the loss levels.
Publishing Year
Journal Title
Optics Express
Volume
32
Issue
13
Page
22878
ISSN
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Hammer M, Babel S, Farheen H, et al. Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides. Optics Express. 2024;32(13):22878. doi:10.1364/oe.521766
Hammer, M., Babel, S., Farheen, H., Padberg, L., Scheytt, J. C., Silberhorn, C., & Förstner, J. (2024). Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides. Optics Express, 32(13), 22878. https://doi.org/10.1364/oe.521766
@article{Hammer_Babel_Farheen_Padberg_Scheytt_Silberhorn_Förstner_2024, title={Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides}, volume={32}, DOI={10.1364/oe.521766}, number={13}, journal={Optics Express}, publisher={Optica Publishing Group}, author={Hammer, Manfred and Babel, Silia and Farheen, Henna and Padberg, Laura and Scheytt, J. Christoph and Silberhorn, Christine and Förstner, Jens}, year={2024}, pages={22878} }
Hammer, Manfred, Silia Babel, Henna Farheen, Laura Padberg, J. Christoph Scheytt, Christine Silberhorn, and Jens Förstner. “Estimation of Losses Caused by Sidewall Roughness in Thin-Film Lithium Niobate Rib and Strip Waveguides.” Optics Express 32, no. 13 (2024): 22878. https://doi.org/10.1364/oe.521766.
M. Hammer et al., “Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides,” Optics Express, vol. 32, no. 13, p. 22878, 2024, doi: 10.1364/oe.521766.
Hammer, Manfred, et al. “Estimation of Losses Caused by Sidewall Roughness in Thin-Film Lithium Niobate Rib and Strip Waveguides.” Optics Express, vol. 32, no. 13, Optica Publishing Group, 2024, p. 22878, doi:10.1364/oe.521766.
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