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151 Publications
2019 | Journal Article | LibreCat-ID: 13048
Kampmann, Matthias, et al. “Built-in Test for Hidden Delay Faults.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 38, no. 10, IEEE, 2019, pp. 1956–68.
LibreCat
2019 | Conference Paper | LibreCat-ID: 12918
Maaz, Mohammad Urf, et al. “A Hybrid Space Compactor for Adaptive X-Handling.” 50th IEEE International Test Conference (ITC), IEEE, 2019, pp. 1–8.
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2018 | Misc | LibreCat-ID: 4576
Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung für den Hochgeschwindigkeitstest. 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.
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2018 | Journal Article | LibreCat-ID: 12974
Hellebrand, Sybille, et al. “Guest Editors’ Introduction - Special Issue on Approximate Computing.” IEEE Embedded Systems Letters, vol. 10, no. 1, IEEE, 2018, pp. 1–1, doi:10.1109/les.2018.2789942.
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2018 | Journal Article | LibreCat-ID: 13057
Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability, vol. 80, 2018, pp. 124–33.
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2018 | Conference Paper | LibreCat-ID: 4575
Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test.” 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, 2018, doi:10.1109/ddecs.2018.00020.
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2018 | Conference Paper | LibreCat-ID: 10575
Liu, Chang, et al. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.” 27th IEEE Asian Test Symposium (ATS’18), 2018, doi:10.1109/ats.2018.00028.
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2017 | Conference Paper | LibreCat-ID: 12973
Deshmukh, Jyotirmoy, et al. “Special Session on Early Life Failures.” 35th IEEE VLSI Test Symposium (VTS’17), IEEE, 2017, doi:10.1109/vts.2017.7928933.
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2017 | Misc | LibreCat-ID: 13078
Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz. 2017.
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2017 | Conference Paper | LibreCat-ID: 10576
Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.” 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017, doi:10.1109/ddecs.2017.7934564.
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2016 | Conference Paper | LibreCat-ID: 12975
Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” 25th IEEE Asian Test Symposium (ATS’16), IEEE, 2016, pp. 1–6, doi:10.1109/ats.2016.20.
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2015 | Conference Paper | LibreCat-ID: 12976
Kampmann, Matthias, et al. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” 24th IEEE Asian Test Symposium (ATS’15), IEEE, 2015, pp. 109–14, doi:10.1109/ats.2015.26.
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2015 | Journal Article | LibreCat-ID: 13056
Huang, Zhengfeng, et al. “A High Performance SEU Tolerant Latch.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 31, no. 4, Springer, 2015, pp. 349–59.
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2015 | Misc | LibreCat-ID: 13077
Hellebrand, Sybille, et al. Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 2015.
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2014 | Conference Paper | LibreCat-ID: 12977
Hellebrand, Sybille, et al. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.” IEEE International Test Conference (ITC’14), IEEE, 2014, doi:10.1109/test.2014.7035360.
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2014 | Journal Article | LibreCat-ID: 13054
Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It), vol. 56, no. 4, DeGruyter, 2014, pp. 165–72.
LibreCat
2014 | Journal Article | LibreCat-ID: 13055
Rodriguez Gomez, Laura, et al. “Adaptive Bayesian Diagnosis of Intermittent Faults.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 30, no. 5, Springer, 2014, pp. 527–40.
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2013 | Conference Paper | LibreCat-ID: 12979
Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.” 14th IEEE Latin American Test Workshop - (LATW’13), IEEE, 2013, doi:10.1109/latw.2013.6562662.
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2013 | Misc | LibreCat-ID: 13075
Cook, Alejandro, et al. Adaptive Test and Diagnosis of Intermittent Faults. 2013.
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2012 | Conference Paper | LibreCat-ID: 12980
Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” 13th IEEE Latin American Test Workshop (LATW’12), IEEE, 2012, pp. 1–4, doi:10.1109/latw.2012.6261229.
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