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151 Publications


2016 | Conference Paper | LibreCat-ID: 12975
M. Kampmann and S. Hellebrand, “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test,” in 25th IEEE Asian Test Symposium (ATS’16), 2016, pp. 1–6.
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2015 | Conference Paper | LibreCat-ID: 12976
M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich, “Optimized Selection of Frequencies for Faster-Than-at-Speed Test,” in 24th IEEE Asian Test Symposium (ATS’15), 2015, pp. 109–114.
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2015 | Journal Article | LibreCat-ID: 13056
Z. Huang, H. Liang, and S. Hellebrand, “A High Performance SEU Tolerant Latch,” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 31, no. 4, pp. 349–359, 2015.
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2015 | Misc | LibreCat-ID: 13077
S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, and H.-J. Wunderlich, Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
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2014 | Conference Paper | LibreCat-ID: 12977
S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, and H.-J. Wunderlich, “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects,” in IEEE International Test Conference (ITC’14), 2014.
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2014 | Journal Article | LibreCat-ID: 13054
S. Hellebrand and H.-J. Wunderlich, “SAT-Based ATPG beyond Stuck-at Fault Testing,” DeGruyter Journal on Information Technology (it), vol. 56, no. 4, pp. 165–172, 2014.
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2014 | Journal Article | LibreCat-ID: 13055
L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich, “Adaptive Bayesian Diagnosis of Intermittent Faults,” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 30, no. 5, pp. 527–540, 2014.
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2013 | Conference Paper | LibreCat-ID: 12979
S. Hellebrand, “Analyzing and Quantifying Fault Tolerance Properties,” in 14th IEEE Latin American Test Workshop - (LATW’13), 2013.
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2013 | Misc | LibreCat-ID: 13075
A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
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2012 | Conference Paper | LibreCat-ID: 12980
A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, and H.-J. Wunderlich, “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test,” in 13th IEEE Latin American Test Workshop (LATW’12), 2012, pp. 1–4.
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2012 | Conference Paper | LibreCat-ID: 12981
A. Cook, S. Hellebrand, and H.-J. Wunderlich, “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test,” in 17th IEEE European Test Symposium (ETS’12), 2012, pp. 1–6.
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2012 | Misc | LibreCat-ID: 13074
A. Cook, S. Hellebrand, and H.-J. Wunderlich, Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.
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2011 | Conference Paper | LibreCat-ID: 12982
A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Diagnostic Test of Robust Circuits,” in 20th IEEE Asian Test Symposium (ATS’11), 2011, pp. 285–290.
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2011 | Conference Paper | LibreCat-ID: 12984
I. Polian, B. Becker, S. Hellebrand, H.-J. Wunderlich, and P. Maxwell, “Towards Variation-Aware Test Methods,” in 16th IEEE European Test Symposium Trondheim (ETS’11), 2011.
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2011 | Conference Paper | LibreCat-ID: 13053
A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Robuster Selbsttest mit Diagnose,” in 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf,” 2011, pp. 48–53.
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2011 | Journal Article | LibreCat-ID: 13052
F. Hopsch et al., “Variation-Aware Fault Modeling,” SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer, vol. 54, no. 4, pp. 1813–1826, 2011.
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2010 | Misc | LibreCat-ID: 10670
V. Fröse, R. Ibers, and S. Hellebrand, Testdatenkompression mit Hilfe der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.
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2010 | Conference Paper | LibreCat-ID: 12987
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” in 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), 2010.
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2010 | Conference Paper | LibreCat-ID: 13051
M. Hunger and S. Hellebrand, “Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz,” in 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf,” 2010, pp. 81–88.
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2010 | Misc | LibreCat-ID: 13073
S. Hellebrand, Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180, 2010.
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