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165 Publications
1998 | Misc | LibreCat-ID: 13091
N. Yarmolik, V., Hellebrand, S., & Wunderlich, H.-J. (1998). Efficient Consistency Checking for Embedded Memories. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA.
LibreCat
1998 | Misc | LibreCat-ID: 13092
N. Yarmolik, V., Hellebrand, S., & Wunderlich, H.-J. (1998). Efficient Consistency Checking for Embedded Memories. 10th GI/ITG/GMM/IEEE Workshop.
LibreCat
1998 | Book Chapter | LibreCat-ID: 13060
Hellebrand, S., Wunderlich, H.-J., & Hertwig, A. (1998). Mixed-Mode BIST Using Embedded Processors. In Mixed-Mode BIST Using Embedded Processors. Kluwer Academic Publishers.
LibreCat
1998 | Journal Article | LibreCat-ID: 13061
Hellebrand, S., Wunderlich, H.-J., & Hertwig, A. (1998). Mixed-Mode BIST Using Embedded Processors. Journal of Electronic Testing Theory and Applications - JETTA, 12(1/2), 127–138.
LibreCat
1998 | Journal Article | LibreCat-ID: 13064
Hellebrand, S., Hertwig, A., & Wunderlich, H.-J. (1998). Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications. IEEE Design and Test, 15(4), 36–41.
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1998 | Conference Paper | LibreCat-ID: 13007
Hertwig, A., Hellebrand, S., & Wunderlich, H.-J. (1998). Fast Self-Recovering Controllers. 16th IEEE VLSI Test Symposium (VTS’98), 296–302. https://doi.org/10.1109/vtest.1998.670883
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| DOI
1998 | Conference Paper | LibreCat-ID: 13008
Hellebrand, S., Wunderlich, H.-J., & N. Yarmolik, V. (1998). Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs. Design Automation and Test in Europe (DATE’98), 173–179. https://doi.org/10.1109/date.1998.655853
LibreCat
| DOI
1998 | Conference Paper | LibreCat-ID: 13063
N. Yarmolik, V., V. Klimets, Y., Hellebrand, S., & Wunderlich, H.-J. (1998). New Transparent RAM BIST Based on Self-Adjusting Output Data Compression. Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), 27–33.
LibreCat
1997 | Misc | LibreCat-ID: 13089
Tsai, K.-H., Hellebrand, S., Rajski, J., & Marek-Sadowska, M. (1997). STARBIST: Scan Autocorrelated Random Pattern Generation. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA.
LibreCat
1997 | Misc | LibreCat-ID: 13090
Hertwig, A., Hellebrand, S., & Wunderlich, H.-J. (1997). Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications. 3rd IEEE International On-Line Testing Workshop, Crete, Greece.
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