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165 Publications
1997 | Conference Paper | LibreCat-ID: 13009
@inproceedings{Tsai_Hellebrand_Marek-Sadowska_Rajski_1997, place={Anaheim, CA, USA}, title={STARBIST: Scan Autocorrelated Random Pattern Generation}, DOI={10.1109/dac.1997.597194}, booktitle={34th ACM/IEEE Design Automation Conference (DAC’97)}, publisher={IEEE}, author={Tsai, Kun-Han and Hellebrand, Sybille and Marek-Sadowska, Malgorzata and Rajski, Janusz}, year={1997} }
LibreCat
| DOI
1996 | Misc | LibreCat-ID: 13087
@book{Hellebrand_Wunderlich_1996, place={3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA}, title={Using Embedded Processors for BIST}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1996} }
LibreCat
1996 | Misc | LibreCat-ID: 13088
@book{Hellebrand_Wunderlich_Hertwig_1996, place={2nd IEEE International On-Line Testing Workshop. Biarritz, France}, title={Mixed-Mode BIST Using Embedded Processors}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}, year={1996} }
LibreCat
1996 | Conference Paper | LibreCat-ID: 13010
@inproceedings{Hellebrand_Wunderlich_Hertwig_1996, place={Washington, DC, USA}, title={Mixed-Mode BIST Using Embedded Processors}, DOI={10.1109/test.1996.556962}, booktitle={IEEE International Test Conference (ITC’96)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}, year={1996}, pages={195–204} }
LibreCat
| DOI
1995 | Report | LibreCat-ID: 13026
@book{Hellebrand_Wunderlich_1995, place={University of Siegen, Germany}, title={Synthesis Procedures for Self-Testable Controllers}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1995} }
LibreCat
1995 | Report | LibreCat-ID: 13027
@book{Hellebrand_Wunderlich_Goncalves_Paulo Teixeira_1995, place={University Siegen, Germany}, title={Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Goncalves, F. and Paulo Teixeira, Joao}, year={1995} }
LibreCat
1995 | Report | LibreCat-ID: 13028
@book{Hellebrand_Herzog_Wunderlich_1995, place={University of Siegen, Germany}, title={Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing}, author={Hellebrand, Sybille and Herzog, Maik and Wunderlich, Hans-Joachim}, year={1995} }
LibreCat
1995 | Misc | LibreCat-ID: 13086
@book{Hellebrand_Reeb_Tarnick_Wunderlich_1995, place={2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA}, title={Pattern Generation for a Deterministic BIST Scheme}, author={Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim}, year={1995} }
LibreCat
1995 | Journal Article | LibreCat-ID: 13011
@article{Hellebrand_Rajski_Tarnick_Venkataraman_Courtois_1995, title={Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}, volume={44}, DOI={10.1109/12.364534}, number={2}, journal={IEEE Transactions on Computers}, publisher={IEEE}, author={Hellebrand, Sybille and Rajski, Janusz and Tarnick, Steffen and Venkataraman, Srikanth and Courtois, B.}, year={1995}, pages={223–233} }
LibreCat
| DOI
1995 | Conference Paper | LibreCat-ID: 13012
@inproceedings{Hellebrand_Reeb_Tarnick_Wunderlich_1995, place={San Jose, CA, USA}, title={Pattern Generation for a Deterministic BIST Scheme}, DOI={10.1109/iccad.1995.479997}, booktitle={ACM/IEEE International Conference on Computer Aided Design (ICCAD’95)}, publisher={IEEE}, author={Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim}, year={1995}, pages={88–94} }
LibreCat
| DOI