Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers

S. Hellebrand, J. Rajski, S. Tarnick, S. Venkataraman, B. Courtois, {IEEE Transactions on Computers} 44 (1995) 223–233.

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Journal Article | English
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{IEEE Transactions on Computers}
Volume
44
Issue
2
Page
223-233
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Hellebrand S, Rajski J, Tarnick S, Venkataraman S, Courtois B. Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. {IEEE Transactions on Computers}. 1995;44(2):223-233. doi:10.1109/12.364534
Hellebrand, S., Rajski, J., Tarnick, S., Venkataraman, S., & Courtois, B. (1995). Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. {IEEE Transactions on Computers}, 44(2), 223–233. https://doi.org/10.1109/12.364534
@article{Hellebrand_Rajski_Tarnick_Venkataraman_Courtois_1995, title={Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}, volume={44}, DOI={10.1109/12.364534}, number={2}, journal={{IEEE Transactions on Computers}}, publisher={Institute of Electrical and Electronics Engineers ({IEEE})}, author={Hellebrand, Sybille and Rajski, Janusz and Tarnick, Steffen and Venkataraman, Srikanth and Courtois, B.}, year={1995}, pages={223–233} }
Hellebrand, Sybille, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, and B. Courtois. “Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” {IEEE Transactions on Computers} 44, no. 2 (1995): 223–33. https://doi.org/10.1109/12.364534.
S. Hellebrand, J. Rajski, S. Tarnick, S. Venkataraman, and B. Courtois, “Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers,” {IEEE Transactions on Computers}, vol. 44, no. 2, pp. 223–233, 1995.
Hellebrand, Sybille, et al. “Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” {IEEE Transactions on Computers}, vol. 44, no. 2, Institute of Electrical and Electronics Engineers ({IEEE}), 1995, pp. 223–33, doi:10.1109/12.364534.

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