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165 Publications
1997 | Conference Paper | LibreCat-ID: 13009
Tsai K-H, Hellebrand S, Marek-Sadowska M, Rajski J. STARBIST: Scan Autocorrelated Random Pattern Generation. In: 34th ACM/IEEE Design Automation Conference (DAC’97). IEEE; 1997. doi:10.1109/dac.1997.597194
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1996 | Misc | LibreCat-ID: 13087
Hellebrand S, Wunderlich H-J. Using Embedded Processors for BIST. 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA; 1996.
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1996 | Misc | LibreCat-ID: 13088
Hellebrand S, Wunderlich H-J, Hertwig A. Mixed-Mode BIST Using Embedded Processors. 2nd IEEE International On-Line Testing Workshop. Biarritz, France; 1996.
LibreCat
1996 | Conference Paper | LibreCat-ID: 13010
Hellebrand S, Wunderlich H-J, Hertwig A. Mixed-Mode BIST Using Embedded Processors. In: IEEE International Test Conference (ITC’96). IEEE; 1996:195-204. doi:10.1109/test.1996.556962
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1995 | Report | LibreCat-ID: 13026
Hellebrand S, Wunderlich H-J. Synthesis Procedures for Self-Testable Controllers. University of Siegen, Germany; 1995.
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1995 | Report | LibreCat-ID: 13027
Hellebrand S, Wunderlich H-J, Goncalves F, Paulo Teixeira J. Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis. University Siegen, Germany; 1995.
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1995 | Report | LibreCat-ID: 13028
Hellebrand S, Herzog M, Wunderlich H-J. Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing. University of Siegen, Germany; 1995.
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1995 | Misc | LibreCat-ID: 13086
Hellebrand S, Reeb B, Tarnick S, Wunderlich H-J. Pattern Generation for a Deterministic BIST Scheme. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA; 1995.
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1995 | Journal Article | LibreCat-ID: 13011
Hellebrand S, Rajski J, Tarnick S, Venkataraman S, Courtois B. Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Transactions on Computers. 1995;44(2):223-233. doi:10.1109/12.364534
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1995 | Conference Paper | LibreCat-ID: 13012
Hellebrand S, Reeb B, Tarnick S, Wunderlich H-J. Pattern Generation for a Deterministic BIST Scheme. In: ACM/IEEE International Conference on Computer Aided Design (ICCAD’95). IEEE; 1995:88-94. doi:10.1109/iccad.1995.479997
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