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165 Publications
2004 | Conference Paper | LibreCat-ID: 13001
Wuertenberger A, S. Tautermann C, Hellebrand S. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. In: IEEE International Test Conference (ITC’04). IEEE; 2004:926-935. doi:10.1109/test.2004.1387357
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| DOI
2003 | Misc | LibreCat-ID: 13098
Breu R, Hellebrand S, Welzl M. Experiences from Teaching Software Development in a Java Environment. Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia; 2003.
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2003 | Conference Paper | LibreCat-ID: 13002
Wuertenberger A, S. Tautermann C, Hellebrand S. A Hybrid Coding Strategy for Optimized Test Data Compression. In: IEEE International Test Conference (ITC’03). IEEE; 2003:451-459. doi:10.1109/test.2003.1270870
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| DOI
2002 | Misc | LibreCat-ID: 13097
Hellebrand S, Wuertenberger A. Alternating Run-Length Coding: A Technique for Improved Test Data Compression. IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA; 2002.
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2002 | Journal Article | LibreCat-ID: 13003
Hellebrand S, Wunderlich H-J, A. Ivaniuk A, V. Klimets Y, N. Yarmolik V. Efficient Online and Offline Testing of Embedded DRAMs. IEEE Transactions on Computers. 2002;51(7):801-809. doi:10.1109/tc.2002.1017700
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| DOI
2002 | Journal Article | LibreCat-ID: 13069
Hellebrand S, Liang H-G, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. Journal of Electronic Testing - Theory and Applications (JETTA). 2002;18(2):157-168.
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2002 | Journal Article | LibreCat-ID: 13070
Liang H, Hellebrand S, Wunderlich H-J. A Mixed-Mode BIST Scheme Based on Folding Compression. Journal on Computer Science and Technology. 2002;17(2):203-212.
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2001 | Misc | LibreCat-ID: 13096
Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden; 2001.
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2001 | Conference Paper | LibreCat-ID: 13004
Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. In: IEEE International Test Conference (ITC’01). IEEE; 2001:894-902. doi:10.1109/test.2001.966712
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| DOI
2001 | Journal Article | LibreCat-ID: 13047
Liang H-G, Hellebrand S, Wunderlich H-J. Deterministic BIST Scheme Based on Reseeding of Folding Counters. Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan). 2001;38(8):931.
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2001 | Journal Article | LibreCat-ID: 13068
Hellebrand S, Liang H-G, Wunderlich H-J. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. Journal of Electronic Testing - Theory and Applications (JETTA). 2001;17(3/4):341-349.
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2000 | Misc | LibreCat-ID: 13094
Hellebrand S, Wunderlich H-J. Hardwarepraktikum Im Diplomstudiengang Informatik. Handbuch Lehre, Berlin, Raabe Verlag; 2000.
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2000 | Misc | LibreCat-ID: 13095
Hellebrand S, Liang H-G, Wunderlich H-J. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. IEEE European Test Workshop, Cascais, Portugal; 2000.
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2000 | Conference Paper | LibreCat-ID: 13005
Hellebrand S, Liang H-G, Wunderlich H-J. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. In: IEEE International Test Conference (ITC’00). IEEE; 2000:778-784. doi:10.1109/test.2000.894274
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| DOI
1999 | Book | LibreCat-ID: 13065
Hellebrand S. Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren. Verlag Dr. Kovac, Hamburg: Verlag Dr. Kovac, Hamburg; 1999.
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1999 | Misc | LibreCat-ID: 13093
Hellebrand S, Wunderlich H-J, N. Yarmolik V. Exploiting Symmetries to Speed Up Transparent BIST. 11th GI/ITG/GMM/IEEE Workshop; 1999.
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1999 | Conference Paper | LibreCat-ID: 13006
Hellebrand S, Wunderlich H-J, A. Ivaniuk A, V. Klimets Y, N. Yarmolik V. Error Detecting Refreshment for Embedded DRAMs. In: 17th IEEE VLSI Test Symposium (VTS’99). IEEE; 1999:384-390. doi:10.1109/vtest.1999.766693
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| DOI
1999 | Conference Paper | LibreCat-ID: 13066
N. Yarmolik V, V. Bykov I, Hellebrand S, Wunderlich H-J. Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms. In: Third European Dependable Computing Conference (EDCC-3). ; 1999.
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1999 | Conference Paper | LibreCat-ID: 13067
Hellebrand S, Wunderlich H-J, N. Yarmolik V. Symmetric Transparent BIST for RAMs. In: Design Automation and Test in Europe (DATE’99). ; 1999:702-707.
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1998 | Report | LibreCat-ID: 13029
Hellebrand S, Wunderlich H-J. Test Und Synthese Schneller Eingebetteter Systeme. Universität Stuttgart; 1998.
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