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165 Publications
2004 | Conference Paper | LibreCat-ID: 13001
Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” IEEE International Test Conference (ITC’04), IEEE, 2004, pp. 926–35, doi:10.1109/test.2004.1387357.
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| DOI
2003 | Misc | LibreCat-ID: 13098
Breu, Ruth, et al. Experiences from Teaching Software Development in a Java Environment. 2003.
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2003 | Conference Paper | LibreCat-ID: 13002
Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data Compression.” IEEE International Test Conference (ITC’03), IEEE, 2003, pp. 451–59, doi:10.1109/test.2003.1270870.
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| DOI
2002 | Misc | LibreCat-ID: 13097
Hellebrand, Sybille, and Armin Wuertenberger. Alternating Run-Length Coding: A Technique for Improved Test Data Compression. 2002.
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2002 | Journal Article | LibreCat-ID: 13003
Hellebrand, Sybille, et al. “Efficient Online and Offline Testing of Embedded DRAMs.” IEEE Transactions on Computers, vol. 51, no. 7, IEEE, 2002, pp. 801–09, doi:10.1109/tc.2002.1017700.
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| DOI
2002 | Journal Article | LibreCat-ID: 13069
Hellebrand, Sybille, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 18, no. 2, 2002, pp. 157–68.
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2002 | Journal Article | LibreCat-ID: 13070
Liang, Huaguo, et al. “A Mixed-Mode BIST Scheme Based on Folding Compression.” Journal on Computer Science and Technology, vol. 17, no. 2, 2002, pp. 203–12.
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2001 | Misc | LibreCat-ID: 13096
Liang, Hua-Guo, et al. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. 2001.
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2001 | Conference Paper | LibreCat-ID: 13004
Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” IEEE International Test Conference (ITC’01), IEEE, 2001, pp. 894–902, doi:10.1109/test.2001.966712.
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| DOI
2001 | Journal Article | LibreCat-ID: 13047
Liang, Hua-Guo, et al. “Deterministic BIST Scheme Based on Reseeding of Folding Counters.” Journal of Computer Research and Development, (Jisuanji Yanjiu Yu Fazhan), vol. 38, no. 8, 2001, p. 931.
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2001 | Journal Article | LibreCat-ID: 13068
Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 17, no. 3/4, 2001, pp. 341–49.
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2000 | Misc | LibreCat-ID: 13094
Hellebrand, Sybille, and Hans-Joachim Wunderlich. Hardwarepraktikum Im Diplomstudiengang Informatik. 2000.
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2000 | Misc | LibreCat-ID: 13095
Hellebrand, Sybille, et al. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. 2000.
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2000 | Conference Paper | LibreCat-ID: 13005
Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” IEEE International Test Conference (ITC’00), IEEE, 2000, pp. 778–84, doi:10.1109/test.2000.894274.
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| DOI
1999 | Book | LibreCat-ID: 13065
Hellebrand, Sybille. Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren. Verlag Dr. Kovac, Hamburg, 1999.
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1999 | Misc | LibreCat-ID: 13093
Hellebrand, Sybille, et al. Exploiting Symmetries to Speed Up Transparent BIST. 1999.
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1999 | Conference Paper | LibreCat-ID: 13006
Hellebrand, Sybille, et al. “Error Detecting Refreshment for Embedded DRAMs.” 17th IEEE VLSI Test Symposium (VTS’99), IEEE, 1999, pp. 384–90, doi:10.1109/vtest.1999.766693.
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| DOI
1999 | Conference Paper | LibreCat-ID: 13066
N. Yarmolik, Vyacheslav, et al. “Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms.” Third European Dependable Computing Conference (EDCC-3), 1999.
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1999 | Conference Paper | LibreCat-ID: 13067
Hellebrand, Sybille, et al. “Symmetric Transparent BIST for RAMs.” Design Automation and Test in Europe (DATE’99), 1999, pp. 702–07.
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1998 | Report | LibreCat-ID: 13029
Hellebrand, Sybille, and Hans-Joachim Wunderlich. Test Und Synthese Schneller Eingebetteter Systeme. 1998.
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