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631 Publications
2002 | Journal Article | LibreCat-ID: 39912
Characterization of submicron NMOS devices due to visible light emission
I. Schönstein, J. Müller, U. Hilleringmann, K. Goser, Microelectronic Engineering 21 (2002) 363–366.
LibreCat
| DOI
I. Schönstein, J. Müller, U. Hilleringmann, K. Goser, Microelectronic Engineering 21 (2002) 363–366.
2002 | Journal Article | LibreCat-ID: 39914
Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
LibreCat
| DOI
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
2002 | Journal Article | LibreCat-ID: 39899
Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 30 (2002) 431–434.
LibreCat
| DOI
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 30 (2002) 431–434.
2002 | Journal Article | LibreCat-ID: 39882
A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 53 (2002) 525–528.
LibreCat
| DOI
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 53 (2002) 525–528.
2002 | Journal Article | LibreCat-ID: 39879
1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 53 (2002) 213–216.
LibreCat
| DOI
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 53 (2002) 213–216.
2002 | Journal Article | LibreCat-ID: 39919
A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits
U. Hilleringmann, K. Knospe, C. Heite, K. Schumacher, K. Goser, Microelectronic Engineering 15 (2002) 289–292.
LibreCat
| DOI
U. Hilleringmann, K. Knospe, C. Heite, K. Schumacher, K. Goser, Microelectronic Engineering 15 (2002) 289–292.
2002 | Journal Article | LibreCat-ID: 39920
Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica
A. Soennecken, U. Hilleringmann, K. Goser, Microelectronic Engineering 15 (2002) 633–636.
LibreCat
| DOI
A. Soennecken, U. Hilleringmann, K. Goser, Microelectronic Engineering 15 (2002) 633–636.
2002 | Journal Article | LibreCat-ID: 39915
Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
LibreCat
| DOI
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
2002 | Journal Article | LibreCat-ID: 39916
CMOS compatible micromachining by dry silicon-etching techniques
S. Adams, U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 191–194.
LibreCat
| DOI
S. Adams, U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 191–194.
2002 | Journal Article | LibreCat-ID: 39889
12 kV low current cascaded light triggered switch on one silicon chip
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 46 (2002) 413–417.
LibreCat
| DOI
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 46 (2002) 413–417.
2002 | Journal Article | LibreCat-ID: 39886
Mesoscopic transport phenomena in ultrashort channel MOSFETs
G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, Solid-State Electronics 43 (2002) 1245–1250.
LibreCat
| DOI
G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, Solid-State Electronics 43 (2002) 1245–1250.
2002 | Journal Article | LibreCat-ID: 39877
A structure definition technique for 25 nm lines of silicon and related materials
U. Hilleringmann, T. Vieregge, J.T. Horstmann, Microelectronic Engineering 53 (2002) 569–572.
LibreCat
| DOI
U. Hilleringmann, T. Vieregge, J.T. Horstmann, Microelectronic Engineering 53 (2002) 569–572.
2002 | Journal Article | LibreCat-ID: 45307
Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity
R. Mahnken, Computer Methods in Applied Mechanics and Engineering 190 (2002) 5057–5080.
LibreCat
| DOI
R. Mahnken, Computer Methods in Applied Mechanics and Engineering 190 (2002) 5057–5080.
2002 | Journal Article | LibreCat-ID: 45412
Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation
R. Mahnken, M. Kohlmeier, Computer Methods in Applied Mechanics and Engineering 190 (2002) 4259–4278.
LibreCat
| DOI
R. Mahnken, M. Kohlmeier, Computer Methods in Applied Mechanics and Engineering 190 (2002) 4259–4278.
2002 | Journal Article | LibreCat-ID: 45424
Parameter identification of gradient enhanced damage models with the finite element method
R. Mahnken, E. Kuhl, European Journal of Mechanics - A/Solids 18 (2002) 819–835.
LibreCat
| DOI
R. Mahnken, E. Kuhl, European Journal of Mechanics - A/Solids 18 (2002) 819–835.
2002 | Journal Article | LibreCat-ID: 45429
A unified approach for parameter identification of inelastic material models in the frame of the finite element method
R. Mahnken, E. Stein, Computer Methods in Applied Mechanics and Engineering 136 (2002) 225–258.
LibreCat
| DOI
R. Mahnken, E. Stein, Computer Methods in Applied Mechanics and Engineering 136 (2002) 225–258.
2002 | Journal Article | LibreCat-ID: 45432
The identification of parameters for visco-plastic models via finite-element methods and gradient methods
R. Mahnken, E. Stein, Modelling and Simulation in Materials Science and Engineering 2 (2002) 597–616.
LibreCat
| DOI
R. Mahnken, E. Stein, Modelling and Simulation in Materials Science and Engineering 2 (2002) 597–616.
2002 | Journal Article | LibreCat-ID: 45428
Parameter identification for finite deformation elasto-plasticity in principal directions
R. Mahnken, E. Stein, Computer Methods in Applied Mechanics and Engineering 147 (2002) 17–39.
LibreCat
| DOI
R. Mahnken, E. Stein, Computer Methods in Applied Mechanics and Engineering 147 (2002) 17–39.
2001 | Journal Article | LibreCat-ID: 11778 | 
Automatic generation of phonetic regression class trees for MLLR adaptation
R. Haeb-Umbach, IEEE Transactions on Speech and Audio Processing 9 (2001) 299–302.
LibreCat
| DOI
| Download (ext.)
R. Haeb-Umbach, IEEE Transactions on Speech and Audio Processing 9 (2001) 299–302.
2001 | Journal Article | LibreCat-ID: 35365
Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics
T. Thiele, J.-F. Berret, S. Müller, C. Schmidt, Journal of Rheology 45 (2001) 29–48.
LibreCat
| DOI
T. Thiele, J.-F. Berret, S. Müller, C. Schmidt, Journal of Rheology 45 (2001) 29–48.