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632 Publications
2002 | Journal Article | LibreCat-ID: 39778
Mertens G, Röder T, Schweins R, Huber K, Kitzerow H-S. Shift of the photonic band gap in two photonic crystal/liquid crystal composites. Applied Physics Letters. 2002;80(11):1885-1887. doi:10.1063/1.1461885
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39912
Schönstein I, Müller J, Hilleringmann U, Goser K. Characterization of submicron NMOS devices due to visible light emission. Microelectronic Engineering. 2002;21(1-4):363-366. doi:10.1016/0167-9317(93)90092-j
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39914
Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39899
Horstmann JT, Hilleringmann U, Goser K. Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique. Microelectronic Engineering. 2002;30(1-4):431-434. doi:10.1016/0167-9317(95)00280-4
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39882
Mankowski V, Hilleringmann U, Schumacher K. A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV. Microelectronic Engineering. 2002;53(1-4):525-528. doi:10.1016/s0167-9317(00)00370-1
LibreCat
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2002 | Journal Article | LibreCat-ID: 39879
Horstmann JT, Hilleringmann U, Goser K. 1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique. Microelectronic Engineering. 2002;53(1-4):213-216. doi:10.1016/s0167-9317(00)00299-9
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39919
Hilleringmann U, Knospe K, Heite C, Schumacher K, Goser K. A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits. Microelectronic Engineering. 2002;15(1-4):289-292. doi:10.1016/0167-9317(91)90231-2
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39920
Soennecken A, Hilleringmann U, Goser K. Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering. 2002;15(1-4):633-636. doi:10.1016/0167-9317(91)90299-s
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39916
Adams S, Hilleringmann U, Goser K. CMOS compatible micromachining by dry silicon-etching techniques. Microelectronic Engineering. 2002;19(1-4):191-194. doi:10.1016/0167-9317(92)90420-v
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39889
Mankowski V, Hilleringmann U, Schumacher K. 12 kV low current cascaded light triggered switch on one silicon chip. Microelectronic Engineering. 2002;46(1-4):413-417. doi:10.1016/s0167-9317(99)00122-7
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39886
Wirth G, Hilleringmann U, Horstmann JT, Goser K. Mesoscopic transport phenomena in ultrashort channel MOSFETs. Solid-State Electronics. 2002;43(7):1245-1250. doi:10.1016/s0038-1101(99)00060-x
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann U, Vieregge T, Horstmann JT. A structure definition technique for 25 nm lines of silicon and related materials. Microelectronic Engineering. 2002;53(1-4):569-572. doi:10.1016/s0167-9317(00)00380-4
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 45307
Mahnken R. Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity. Computer Methods in Applied Mechanics and Engineering. 2002;190(39):5057-5080. doi:10.1016/s0045-7825(00)00364-9
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 45412
Mahnken R, Kohlmeier M. Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation. Computer Methods in Applied Mechanics and Engineering. 2002;190(32-33):4259-4278. doi:10.1016/s0045-7825(00)00317-0
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 45424
Mahnken R, Kuhl E. Parameter identification of gradient enhanced damage models with the finite element method. European Journal of Mechanics - A/Solids. 2002;18(5):819-835. doi:10.1016/s0997-7538(99)00127-8
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 45429
Mahnken R, Stein E. A unified approach for parameter identification of inelastic material models in the frame of the finite element method. Computer Methods in Applied Mechanics and Engineering. 2002;136(3-4):225-258. doi:10.1016/0045-7825(96)00991-7
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 45432
Mahnken R, Stein E. The identification of parameters for visco-plastic models via finite-element methods and gradient methods. Modelling and Simulation in Materials Science and Engineering. 2002;2(3A):597-616. doi:10.1088/0965-0393/2/3a/013
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 45428
Mahnken R, Stein E. Parameter identification for finite deformation elasto-plasticity in principal directions. Computer Methods in Applied Mechanics and Engineering. 2002;147(1-2):17-39. doi:10.1016/s0045-7825(97)00008-x
LibreCat
| DOI
2001 | Journal Article | LibreCat-ID: 11778 | 
Haeb-Umbach R. Automatic generation of phonetic regression class trees for MLLR adaptation. IEEE Transactions on Speech and Audio Processing. 2001;9(3):299-302. doi:10.1109/89.906003
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