High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy
R. Köthemann, N. Weber, J.K.N. Lindner, C. Meier, Semiconductor Science and Technology 34 (2019).
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Journal Article
| Published
| English
Author
Köthemann, Ronja;
Weber, Nils;
Lindner, Jörg K N;
Meier, CedrikLibreCat 
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Publishing Year
Journal Title
Semiconductor Science and Technology
Volume
34
Issue
9
Article Number
095009
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Köthemann R, Weber N, Lindner JKN, Meier C. High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy. Semiconductor Science and Technology. 2019;34(9). doi:10.1088/1361-6641/ab3536
Köthemann, R., Weber, N., Lindner, J. K. N., & Meier, C. (2019). High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy. Semiconductor Science and Technology, 34(9). https://doi.org/10.1088/1361-6641/ab3536
@article{Köthemann_Weber_Lindner_Meier_2019, title={High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy}, volume={34}, DOI={10.1088/1361-6641/ab3536}, number={9095009}, journal={Semiconductor Science and Technology}, author={Köthemann, Ronja and Weber, Nils and Lindner, Jörg K N and Meier, Cedrik}, year={2019} }
Köthemann, Ronja, Nils Weber, Jörg K N Lindner, and Cedrik Meier. “High-Precision Determination of Silicon Nanocrystals: Optical Spectroscopy versus Electron Microscopy.” Semiconductor Science and Technology 34, no. 9 (2019). https://doi.org/10.1088/1361-6641/ab3536.
R. Köthemann, N. Weber, J. K. N. Lindner, and C. Meier, “High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy,” Semiconductor Science and Technology, vol. 34, no. 9, 2019.
Köthemann, Ronja, et al. “High-Precision Determination of Silicon Nanocrystals: Optical Spectroscopy versus Electron Microscopy.” Semiconductor Science and Technology, vol. 34, no. 9, 095009, 2019, doi:10.1088/1361-6641/ab3536.
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