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165 Publications
2004 | Conference Paper | LibreCat-ID: 13001
Wuertenberger, A., S. Tautermann, C., & Hellebrand, S. (2004). Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. IEEE International Test Conference (ITC’04), 926–935. https://doi.org/10.1109/test.2004.1387357
LibreCat
| DOI
2003 | Misc | LibreCat-ID: 13098
Breu, R., Hellebrand, S., & Welzl, M. (2003). Experiences from Teaching Software Development in a Java Environment. Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia.
LibreCat
2003 | Conference Paper | LibreCat-ID: 13002
Wuertenberger, A., S. Tautermann, C., & Hellebrand, S. (2003). A Hybrid Coding Strategy for Optimized Test Data Compression. IEEE International Test Conference (ITC’03), 451–459. https://doi.org/10.1109/test.2003.1270870
LibreCat
| DOI
2002 | Misc | LibreCat-ID: 13097
Hellebrand, S., & Wuertenberger, A. (2002). Alternating Run-Length Coding: A Technique for Improved Test Data Compression. IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA.
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2002 | Journal Article | LibreCat-ID: 13003
Hellebrand, S., Wunderlich, H.-J., A. Ivaniuk, A., V. Klimets, Y., & N. Yarmolik, V. (2002). Efficient Online and Offline Testing of Embedded DRAMs. IEEE Transactions on Computers, 51(7), 801–809. https://doi.org/10.1109/tc.2002.1017700
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 13069
Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2002). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. Journal of Electronic Testing - Theory and Applications (JETTA), 18(2), 157–168.
LibreCat
2002 | Journal Article | LibreCat-ID: 13070
Liang, H., Hellebrand, S., & Wunderlich, H.-J. (2002). A Mixed-Mode BIST Scheme Based on Folding Compression. Journal on Computer Science and Technology, 17(2), 203–212.
LibreCat
2001 | Misc | LibreCat-ID: 13096
Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden.
LibreCat
2001 | Conference Paper | LibreCat-ID: 13004
Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE International Test Conference (ITC’01), 894–902. https://doi.org/10.1109/test.2001.966712
LibreCat
| DOI
2001 | Journal Article | LibreCat-ID: 13047
Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Deterministic BIST Scheme Based on Reseeding of Folding Counters. Journal of Computer Research and Development, (Jisuanji Yanjiu Yu Fazhan), 38(8), 931.
LibreCat
2001 | Journal Article | LibreCat-ID: 13068
Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2001). A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. Journal of Electronic Testing - Theory and Applications (JETTA), 17(3/4), 341–349.
LibreCat
2000 | Misc | LibreCat-ID: 13094
Hellebrand, S., & Wunderlich, H.-J. (2000). Hardwarepraktikum im Diplomstudiengang Informatik. Handbuch Lehre, Berlin, Raabe Verlag.
LibreCat
2000 | Misc | LibreCat-ID: 13095
Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2000). A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. IEEE European Test Workshop, Cascais, Portugal.
LibreCat
2000 | Conference Paper | LibreCat-ID: 13005
Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2000). A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. IEEE International Test Conference (ITC’00), 778–784. https://doi.org/10.1109/test.2000.894274
LibreCat
| DOI
1999 | Book | LibreCat-ID: 13065
Hellebrand, S. (1999). Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren. Verlag Dr. Kovac, Hamburg: Verlag Dr. Kovac, Hamburg.
LibreCat
1999 | Misc | LibreCat-ID: 13093
Hellebrand, S., Wunderlich, H.-J., & N. Yarmolik, V. (1999). Exploiting Symmetries to Speed Up Transparent BIST. 11th GI/ITG/GMM/IEEE Workshop.
LibreCat
1999 | Conference Paper | LibreCat-ID: 13006
Hellebrand, S., Wunderlich, H.-J., A. Ivaniuk, A., V. Klimets, Y., & N. Yarmolik, V. (1999). Error Detecting Refreshment for Embedded DRAMs. 17th IEEE VLSI Test Symposium (VTS’99), 384–390. https://doi.org/10.1109/vtest.1999.766693
LibreCat
| DOI
1999 | Conference Paper | LibreCat-ID: 13066
N. Yarmolik, V., V. Bykov, I., Hellebrand, S., & Wunderlich, H.-J. (1999). Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms. Third European Dependable Computing Conference (EDCC-3).
LibreCat
1999 | Conference Paper | LibreCat-ID: 13067
Hellebrand, S., Wunderlich, H.-J., & N. Yarmolik, V. (1999). Symmetric Transparent BIST for RAMs. Design Automation and Test in Europe (DATE’99), 702–707.
LibreCat
1998 | Report | LibreCat-ID: 13029
Hellebrand, S., & Wunderlich, H.-J. (1998). Test und Synthese schneller eingebetteter Systeme. Universität Stuttgart.
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