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1546 Publications
2002 | Journal Article | LibreCat-ID: 39919
U. Hilleringmann, K. Knospe, C. Heite, K. Schumacher, and K. Goser, “A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits,” Microelectronic Engineering, vol. 15, no. 1–4, pp. 289–292, 2002, doi: 10.1016/0167-9317(91)90231-2.
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2002 | Journal Article | LibreCat-ID: 39926
K. Goser, U. Hilleringmann, U. Rueckert, and K. Schumacher, “VLSI technologies for artificial neural networks,” IEEE Micro, vol. 9, no. 6, pp. 28–44, 2002, doi: 10.1109/40.42985.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39920
A. Soennecken, U. Hilleringmann, and K. Goser, “Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica,” Microelectronic Engineering, vol. 15, no. 1–4, pp. 633–636, 2002, doi: 10.1016/0167-9317(91)90299-s.
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2002 | Journal Article | LibreCat-ID: 39915
U. Hilleringmann and K. Goser, “Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon,” Microelectronic Engineering, vol. 19, no. 1–4, pp. 211–214, 2002, doi: 10.1016/0167-9317(92)90425-q.
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2002 | Journal Article | LibreCat-ID: 39916
S. Adams, U. Hilleringmann, and K. Goser, “CMOS compatible micromachining by dry silicon-etching techniques,” Microelectronic Engineering, vol. 19, no. 1–4, pp. 191–194, 2002, doi: 10.1016/0167-9317(92)90420-v.
LibreCat
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2002 | Journal Article | LibreCat-ID: 39348
J. T. Horstmann, U. Hilleringmann, and K. F. Goser, “Matching analysis of deposition defined 50-nm MOSFET’s,” IEEE Transactions on Electron Devices, vol. 45, no. 1, pp. 299–306, 2002, doi: 10.1109/16.658845.
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2002 | Journal Article | LibreCat-ID: 39889
V. Mankowski, U. Hilleringmann, and K. Schumacher, “12 kV low current cascaded light triggered switch on one silicon chip,” Microelectronic Engineering, vol. 46, no. 1–4, pp. 413–417, 2002, doi: 10.1016/s0167-9317(99)00122-7.
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2002 | Journal Article | LibreCat-ID: 39891
J. T. Horstmann, U. Hilleringmann, and K. F. Goser, “Matching analysis of deposition defined 50-nm MOSFET’s,” IEEE Transactions on Electron Devices, vol. 45, no. 1, pp. 299–306, 2002, doi: 10.1109/16.658845.
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2002 | Journal Article | LibreCat-ID: 39886
G. Wirth, U. Hilleringmann, J. T. Horstmann, and K. Goser, “Mesoscopic transport phenomena in ultrashort channel MOSFETs,” Solid-State Electronics, vol. 43, no. 7, pp. 1245–1250, 2002, doi: 10.1016/s0038-1101(99)00060-x.
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2002 | Journal Article | LibreCat-ID: 39876
R. Otterbach, U. Hilleringmann, T. J. Horstmann, and K. Goser, “Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications,” Diamond and Related Materials, vol. 10, no. 3–7, pp. 511–514, 2002, doi: 10.1016/s0925-9635(01)00373-9.
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2002 | Journal Article | LibreCat-ID: 39877
U. Hilleringmann, T. Vieregge, and J. T. Horstmann, “A structure definition technique for 25 nm lines of silicon and related materials,” Microelectronic Engineering, vol. 53, no. 1–4, pp. 569–572, 2002, doi: 10.1016/s0167-9317(00)00380-4.
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2002 | Journal Article | LibreCat-ID: 39874
R. Otterbach and U. Hilleringmann, “Reactive ion etching of CVD-diamond for piezoresistive pressure sensors,” Diamond and Related Materials, vol. 11, no. 3–6, pp. 841–844, 2002, doi: 10.1016/s0925-9635(01)00703-8.
LibreCat
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2002 | Journal Article | LibreCat-ID: 45307
R. Mahnken, “Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity,” Computer Methods in Applied Mechanics and Engineering, vol. 190, no. 39, pp. 5057–5080, 2002, doi: 10.1016/s0045-7825(00)00364-9.
LibreCat
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2002 | Journal Article | LibreCat-ID: 45413
R. Mahnken and P. Steinmann, “A finite element algorithm for parameter identification of material models for fluid saturated porous media,” International Journal for Numerical and Analytical Methods in Geomechanics, vol. 25, no. 5, pp. 415–434, 2002, doi: 10.1002/nag.136.
LibreCat
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2002 | Journal Article | LibreCat-ID: 45412
R. Mahnken and M. Kohlmeier, “Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation,” Computer Methods in Applied Mechanics and Engineering, vol. 190, no. 32–33, pp. 4259–4278, 2002, doi: 10.1016/s0045-7825(00)00317-0.
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2002 | Journal Article | LibreCat-ID: 45418
R. Mahnken, D. Tikhomirov, and E. Stein, “Implicit integration scheme and its consistent linearization for an elastoplastic-damage model with application to concrete,” Computers & Structures, vol. 75, no. 2, pp. 135–143, 2002, doi: 10.1016/s0045-7949(99)00089-9.
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2002 | Journal Article | LibreCat-ID: 45423
R. Mahnken, “Improved implementation of an algorithm for non-linear isotropic/kinematic hardening in elastoplasticity,” Communications in Numerical Methods in Engineering, vol. 15, no. 10, pp. 745–754, 2002, doi: 10.1002/(sici)1099-0887(199910)15:10<745::aid-cnm288>3.0.co;2-r.
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2002 | Journal Article | LibreCat-ID: 45417
C. Döbert, R. Mahnken, and E. Stein, “Numerical simulation of interface debonding with a combined damage/friction constitutive model,” Computational Mechanics, vol. 25, no. 5, pp. 456–467, 2002, doi: 10.1007/s004660050493.
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2002 | Journal Article | LibreCat-ID: 45422
R. Mahnken, “A comprehensive study of a multiplicative elastoplasticity model coupled to damage including parameter identification,” Computers & Structures, vol. 74, no. 2, pp. 179–200, 2002, doi: 10.1016/s0045-7949(98)00296-x.
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2002 | Journal Article | LibreCat-ID: 45424
R. Mahnken and E. Kuhl, “Parameter identification of gradient enhanced damage models with the finite element method,” European Journal of Mechanics - A/Solids, vol. 18, no. 5, pp. 819–835, 2002, doi: 10.1016/s0997-7538(99)00127-8.
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