9 Publications

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[9]
2021 | Journal Article | LibreCat-ID: 29210
@article{Wu_Scheytt_2021, title={Analysis and Design of a Charge Sampler With 70-GHz 1-dB Bandwidth in 130-nm SiGe BiCMOS}, volume={68}, DOI={10.1109/tcsi.2021.3094428}, number={9}, journal={IEEE Transactions on Circuits and Systems I: Regular Papers}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Wu, Liang and Scheytt, J. Christoph}, year={2021}, pages={3668–3681} }
LibreCat | Files available | DOI
 
[8]
2020 | Conference Paper | LibreCat-ID: 24021
@inproceedings{Wu_Weizel_Scheytt_2020, place={Sevilla, Spain}, title={Above 60 GHz Bandwidth 10 GS/s Sampling Rate Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology}, DOI={10.1109/ISCAS45731.2020.9180947}, booktitle={2020 IEEE International Symposium on Circuits and Systems (ISCAS)}, publisher={IEEE}, author={Wu, Liang and Weizel, Maxim and Scheytt, Christoph}, year={2020} }
LibreCat | Files available | DOI
 
[7]
2019 | Conference Paper | LibreCat-ID: 24049
@inproceedings{Wu_Weizel_Scheytt_2019, title={70 GHz Large-signal Bandwidth Sampler Using Current-mode Integrate-and-Hold Circuit in 130 nm SiGe BiCMOS Technology}, DOI={10.1109/APMC46564.2019.9038239}, booktitle={Asia-Pacific Microwave Conference (APMC)}, author={Wu, Liang and Weizel, Maxim and Scheytt, Christoph}, year={2019} }
LibreCat | Files available | DOI
 
[6]
2019 | Conference Paper | LibreCat-ID: 24052
@inproceedings{Wu_Weizel_Scheytt_2019, place={Genova, Italy}, title={A 70 GHz Small-signal Bandwidth 40 GS/s Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology}, DOI={10.1109/ICECS46596.2019.8965046}, booktitle={26th IEEE International Conference on Electronics Circuits and Systems (ICECS)}, author={Wu, Liang and Weizel, Maxim and Scheytt, Christoph}, year={2019} }
LibreCat | Files available | DOI
 
[5]
2018 | Conference Paper | LibreCat-ID: 24196
@inproceedings{Wu_Hussain_Abughannam_Müller_Scheytt_Ecker_2018, place={Italy/Taormina}, title={Analog fault simulation automation at schematic level with random sampling techniques}, DOI={10.1109/DTIS.2018.8368549}, booktitle={2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) }, publisher={IEEE}, author={Wu, Liang and Hussain, Mohammad Khizer and Abughannam, Saed and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang}, year={2018} }
LibreCat | Files available | DOI
 
[4]
2018 | Patent | LibreCat-ID: 24198
@article{Scheytt_Wu_2018, title={Integrier‐ und Halte‐Schaltung }, author={Scheytt, Christoph and Wu, Liang}, year={2018} }
LibreCat | Files available
 
[3]
2017 | Conference Paper | LibreCat-ID: 24223
@inproceedings{Wu_Abughannam_Müller_Scheytt_Ecker_2017, place={Lausanne, Switzerland}, title={SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study}, booktitle={2nd Workshop on Resiliency in Embedded Electronic Systems (REES)}, author={Wu, Liang and Abughannam, Saed and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang}, year={2017}, pages={68} }
LibreCat | Files available
 
[2]
2016 | Conference Paper | LibreCat-ID: 24263
@inproceedings{Abughannam_Wu_Müller_Scheytt_Ecker_Novello_2016, title={Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study}, booktitle={Analog 2016 - VDE}, author={Abughannam, Saed and Wu, Liang and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang and Novello, Christiano}, year={2016} }
LibreCat | Files available
 
[1]
2015 | Conference Paper | LibreCat-ID: 24289
@inproceedings{Müller_Wu_Scheytt_Becker_Schoenberg_2015, place={Amsterdam, Netherland}, title={On the Correlation of HW Faults and SW Errors}, booktitle={Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)}, author={Müller, Wolfgang and Wu, Liang and Scheytt, Christoph and Becker, Markus and Schoenberg, Sven}, editor={Mueller-Gritschneder, Daniel and Müller, Wolfgang and Mitra, Subhasish}, year={2015} }
LibreCat
 

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9 Publications

Mark all

[9]
2021 | Journal Article | LibreCat-ID: 29210
@article{Wu_Scheytt_2021, title={Analysis and Design of a Charge Sampler With 70-GHz 1-dB Bandwidth in 130-nm SiGe BiCMOS}, volume={68}, DOI={10.1109/tcsi.2021.3094428}, number={9}, journal={IEEE Transactions on Circuits and Systems I: Regular Papers}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Wu, Liang and Scheytt, J. Christoph}, year={2021}, pages={3668–3681} }
LibreCat | Files available | DOI
 
[8]
2020 | Conference Paper | LibreCat-ID: 24021
@inproceedings{Wu_Weizel_Scheytt_2020, place={Sevilla, Spain}, title={Above 60 GHz Bandwidth 10 GS/s Sampling Rate Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology}, DOI={10.1109/ISCAS45731.2020.9180947}, booktitle={2020 IEEE International Symposium on Circuits and Systems (ISCAS)}, publisher={IEEE}, author={Wu, Liang and Weizel, Maxim and Scheytt, Christoph}, year={2020} }
LibreCat | Files available | DOI
 
[7]
2019 | Conference Paper | LibreCat-ID: 24049
@inproceedings{Wu_Weizel_Scheytt_2019, title={70 GHz Large-signal Bandwidth Sampler Using Current-mode Integrate-and-Hold Circuit in 130 nm SiGe BiCMOS Technology}, DOI={10.1109/APMC46564.2019.9038239}, booktitle={Asia-Pacific Microwave Conference (APMC)}, author={Wu, Liang and Weizel, Maxim and Scheytt, Christoph}, year={2019} }
LibreCat | Files available | DOI
 
[6]
2019 | Conference Paper | LibreCat-ID: 24052
@inproceedings{Wu_Weizel_Scheytt_2019, place={Genova, Italy}, title={A 70 GHz Small-signal Bandwidth 40 GS/s Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology}, DOI={10.1109/ICECS46596.2019.8965046}, booktitle={26th IEEE International Conference on Electronics Circuits and Systems (ICECS)}, author={Wu, Liang and Weizel, Maxim and Scheytt, Christoph}, year={2019} }
LibreCat | Files available | DOI
 
[5]
2018 | Conference Paper | LibreCat-ID: 24196
@inproceedings{Wu_Hussain_Abughannam_Müller_Scheytt_Ecker_2018, place={Italy/Taormina}, title={Analog fault simulation automation at schematic level with random sampling techniques}, DOI={10.1109/DTIS.2018.8368549}, booktitle={2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) }, publisher={IEEE}, author={Wu, Liang and Hussain, Mohammad Khizer and Abughannam, Saed and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang}, year={2018} }
LibreCat | Files available | DOI
 
[4]
2018 | Patent | LibreCat-ID: 24198
@article{Scheytt_Wu_2018, title={Integrier‐ und Halte‐Schaltung }, author={Scheytt, Christoph and Wu, Liang}, year={2018} }
LibreCat | Files available
 
[3]
2017 | Conference Paper | LibreCat-ID: 24223
@inproceedings{Wu_Abughannam_Müller_Scheytt_Ecker_2017, place={Lausanne, Switzerland}, title={SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study}, booktitle={2nd Workshop on Resiliency in Embedded Electronic Systems (REES)}, author={Wu, Liang and Abughannam, Saed and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang}, year={2017}, pages={68} }
LibreCat | Files available
 
[2]
2016 | Conference Paper | LibreCat-ID: 24263
@inproceedings{Abughannam_Wu_Müller_Scheytt_Ecker_Novello_2016, title={Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study}, booktitle={Analog 2016 - VDE}, author={Abughannam, Saed and Wu, Liang and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang and Novello, Christiano}, year={2016} }
LibreCat | Files available
 
[1]
2015 | Conference Paper | LibreCat-ID: 24289
@inproceedings{Müller_Wu_Scheytt_Becker_Schoenberg_2015, place={Amsterdam, Netherland}, title={On the Correlation of HW Faults and SW Errors}, booktitle={Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)}, author={Müller, Wolfgang and Wu, Liang and Scheytt, Christoph and Becker, Markus and Schoenberg, Sven}, editor={Mueller-Gritschneder, Daniel and Müller, Wolfgang and Mitra, Subhasish}, year={2015} }
LibreCat
 

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